Field emission: New theory for the derivation of emission area from a Fowler–Nordheim plot

Author(s):  
Richard G. Forbes
Keyword(s):  
2019 ◽  
Vol 64 (10) ◽  
pp. 1530-1540 ◽  
Author(s):  
E. O. Popov ◽  
A. G. Kolosko ◽  
M. A. Chumak ◽  
S. V. Filippov
Keyword(s):  

2019 ◽  
Vol 89 (10) ◽  
pp. 1615
Author(s):  
Е.О. Попов ◽  
А.Г. Колосько ◽  
М.А. Чумак ◽  
С.В. Филиппов

A variety of types for formal determination of one of the main parameters of field emission systems - the emission area was investigated. Using hemisphere on a cylindrical post model built using the COMSOL Multiphysics software package the relationship between known types of emission area estimation was shown. The corresponding values of emission currents were calculated. It was shown that the formal emission area (the ratio of the total current to the current density at the top) provides only ~ 75% of the emission current value. The effect of the anomalous behavior of the effective emission area (intercept of the trend line of current-voltage characteristics) is obtained when the voltage level changes in standard Fowler-Nordheim coordinates. A method for an experimental estimate of the field emission area using the modified Fowler-Nordheim coordinates ln (I/U^(2-η/6)) vs 1/U is proposed. The method is applied to the analysis of field emission data of a multi-tip nanocomposite emitter with carbon nanotubes.


2020 ◽  
Vol 13 (2) ◽  
pp. 101-111

Abstract: In field electron emission (FE) studies, it is important to check and analyze the quality and validity of results experimentally obtained from samples, using suitably plotted current-voltage [Im(Vm)] measurements. For the traditional plotting method, the Fowler-Nordheim (FN) plot, there exists a so-called "orthodoxy test" that can be applied to the FN plot, in order to check whether or not the FE device/system generating the results is "ideal". If it is not ideal, then emitter characterization parameters deduced from the FN plot are likely to be spurious. A new form of FE Im(Vm) data plot, the so-called "Murphy-Good (MG) plot", has recently been introduced (R.G. Forbes, Roy. Soc. Open Sci. 6 (2019) 190912). This aims to improve the precision with which characterization-parameter values (particularly values of formal emission area) can be extracted from FE Im(Vm) data. The present paper compares this new plotting form with the older FN and Millikan-Lauritsen (ML) forms and makes an independent assessment of the consistency with which slope (and hence scaled-field) estimates can be extracted from an MG plot. It is shown that, by using a revised formula for the extraction of scaled-field values, the existing orthodoxy test can be applied to Murphy-Good plots. The development is reported of a prototype web tool that can apply the orthodoxy test to all three forms of FE data plot (ML, MG and FN). Keywords: Field emission, Field electron emission, Murphy-Good plot, Fowler-Nordheim plot, Millikan-Lauritsen plot, Orthodoxy test.


2001 ◽  
Vol 79 (18) ◽  
pp. 2871-2873 ◽  
Author(s):  
D. Shiffler ◽  
M. Ruebush ◽  
M. LaCour ◽  
K. Golby ◽  
R. Umstattd ◽  
...  

Author(s):  
Li Zhang ◽  
James A. Bain ◽  
Jian-Gang Zhu ◽  
Leon Abelmann ◽  
Takahiro Onoue

A method of heat-assisted magnetic recording (HAMR) potentially suitable for probe-based storage systems is characterized. In this work, field emission current from a scanning tunneling microscope (STM) tip is used as the heating source. The tip is made of Ir/Pt alloy. Pulse voltages of 3–7 V with a duration of 500 ns were applied to a CoNi/Pt multilayered film. Written by a blunt tip (radius 1000 nm), marks are formed with a nearly uniform mark size of 170 nm when the pulse voltage is above 4 V. While sharp tip (radius 50 nm) writing achieves no mark. The emission area of our tip-sample system derived from an analytic expression for field emission current is approximately equal to the mark size, and is largely independent of pulse voltage. For the blunt tip, the emission region is almost the same as the mark size. While for the sharp tip, the initially formed mark is too small, so that the domain wall surface tension shrinks the mark and it crashes finally.


2017 ◽  
Vol 9 (38) ◽  
pp. 33229-33237 ◽  
Author(s):  
Oksana Chubenko ◽  
Stanislav S. Baturin ◽  
Kiran K. Kovi ◽  
Anirudha V. Sumant ◽  
Sergey V. Baryshev

Sign in / Sign up

Export Citation Format

Share Document