scholarly journals Applying the Field Emission Orthodoxy Test to Murphy-Good Plots

2020 ◽  
Vol 13 (2) ◽  
pp. 101-111
Keyword(s):  
Field Emission ◽  
Electron Emission ◽  
Field Electron Emission ◽  
Web Tool ◽  
Validity Of Results ◽  
Emission Area ◽  
Field Electron ◽  
Current Voltage ◽  
Parameter Values ◽  
Independent Assessment

Abstract: In field electron emission (FE) studies, it is important to check and analyze the quality and validity of results experimentally obtained from samples, using suitably plotted current-voltage [Im(Vm)] measurements. For the traditional plotting method, the Fowler-Nordheim (FN) plot, there exists a so-called "orthodoxy test" that can be applied to the FN plot, in order to check whether or not the FE device/system generating the results is "ideal". If it is not ideal, then emitter characterization parameters deduced from the FN plot are likely to be spurious. A new form of FE Im(Vm) data plot, the so-called "Murphy-Good (MG) plot", has recently been introduced (R.G. Forbes, Roy. Soc. Open Sci. 6 (2019) 190912). This aims to improve the precision with which characterization-parameter values (particularly values of formal emission area) can be extracted from FE Im(Vm) data. The present paper compares this new plotting form with the older FN and Millikan-Lauritsen (ML) forms and makes an independent assessment of the consistency with which slope (and hence scaled-field) estimates can be extracted from an MG plot. It is shown that, by using a revised formula for the extraction of scaled-field values, the existing orthodoxy test can be applied to Murphy-Good plots. The development is reported of a prototype web tool that can apply the orthodoxy test to all three forms of FE data plot (ML, MG and FN). Keywords: Field emission, Field electron emission, Murphy-Good plot, Fowler-Nordheim plot, Millikan-Lauritsen plot, Orthodoxy test.

scholarly journals Implementation of the orthodoxy test as a validity check on experimental field emission data

2020 ◽  
Vol 71 (1) ◽  
pp. 37-42 ◽  
Author(s):  
Mohammad M. Allaham ◽  
Richard G. Forbes ◽  
Alexandr Knápek ◽  
Marwan S. Mousa
Keyword(s):  
Field Emission ◽  
Electron Emission ◽  
Web Application ◽  
Field Electron Emission ◽  
Emission Data ◽  
Quantitative Test ◽  
Experimental Field ◽  
Validity Check ◽  
Field Electron ◽  
Current Voltage

AbstractIn field electron emission (FE) studies, it is important to check and analyse the quality and validity of experimental current-voltage data, which is usually plotted in one of a small number of standard forms. These include the so-called Fowler-Nordheim (FN), Millikan-Lauritsen (ML) and Murphy-Good (MG) plots. The Field emission orthodoxy test is a simple quantitative test that aims to check for the reasonableness of the values of the parameter “scaled field” that can be extracted from these plots. This is done in order to establish whether characterization parameters extracted from the plot will be reliable or, alternatively, likely to be spurious. This paper summarises the theory behind the orthodoxy test, for each of the plot forms, and confirms that it is easy to apply it to the newly developed MG plot. A simple, new, accessible web application has been developed that extracts scaled-field values from any of these three plot forms, and tests for lack of field emission orthodoxy.

scholarly journals Enhanced Field Electron Emission from Photocurrent Treated Nanostructured Indium Oxide Films

2018 ◽  
Vol 228 ◽  
pp. 04003
Author(s):  
Zhenglin Li ◽  
Fuyuan Si ◽  
Miaomiao Wang ◽  
Weigang He ◽  
Yuwei Zhang
Keyword(s):  
Field Emission ◽  
Indium Oxide ◽  
Electron Emission ◽  
Oxide Films ◽  
Field Electron Emission ◽  
Chemical Vapor Deposition Method ◽  
Treatment Technique ◽  
Field Electron ◽  
Ito Glass ◽  
Indium Oxide Films

Field electron emission currents from nanostructured films always have unsatisfied stability. This paper introduces a photocurrent treatment technique to enhance the filed emission properties, and gives a kind of nanostructured indium oxide film suitable for the technique. The products were prepared on patterned ITO glass substrate by using chemical vapor deposition method. With the increase of reaction time, the morphologies of the films changed from cocoonlike particles to hybrid thin films, and finally flowerlike nanostructures were formed. Photocurrent and field electron emission characteristics of the products have been studied. After photocurrent treatment, the flowerlike indium oxide films show stable field emission current (fluctuation is less than 5%), low field emission threshold (at 7.5 V/m, the current density is 1 mA/cm2) and high enhancement factor of electrical field of 778. The field emission test results validated that the photocurrent treated flowerlike indium oxide films may act as electron emitters and applied in display applications.

Cold field electron emission of large-area arrays of SiC nanowires: photo-enhancement and saturation effects

2016 ◽  
Vol 4 (35) ◽  
pp. 8226-8234 ◽  
Author(s):  
Stefania Carapezzi ◽  
Antonio Castaldini ◽  
Filippo Fabbri ◽  
Francesca Rossi ◽  
Marco Negri ◽  
...  
Keyword(s):  
Field Emission ◽  
Electron Emission ◽  
Field Electron Emission ◽  
Large Area ◽  
Sic Nanowires ◽  
Field Electron ◽  
Saturation Region ◽  
Saturation Effects

Photo-enhanced field emission from SiC nanowires showed the presence of a saturation region, which is of interest for nanotechnological applications.

Growth of Large-Scale Praseodymium Hexaborides (PrB6) Nanowires and Enhanced Field-Emission Performance

2020 ◽  
Vol 15 (2) ◽  
pp. 276-283 ◽  
Author(s):  
Junqi Xu ◽  
Yanrui Wang ◽  
Wenjie Wang ◽  
Zijun Xu ◽  
Yonglei Jia ◽  
...  
Keyword(s):  
Field Emission ◽  
Electron Emission ◽  
Large Scale ◽  
Field Enhancement ◽  
Chemical Vapor ◽  
Field Electron Emission ◽  
Threshold Field ◽  
Analytical Instruments ◽  
Field Electron ◽  
Pressure Chemical

Large-scale PrB6 nanowires were fabricated by an effective, catalyst-free, and a simple low-pressure chemical vapor deposition (LPCVD) process. These nanowires, characterized in detail by various analytical instruments, demonstrated the large aspect ratio and high single-crystalline grown along the [001] crystal direction perpendicular to the (001) crystal plane. The field electron emission equipment tests manifest that the asgrown PrB6 products have a low turn-on field (Eto, 2.32 V/μm), a threshold field (Ethr, 4.28 V/μm), a high field enhancement factor (β, 2336), as well as a stable current-density (J) of field-emission. The relationships of the field electron emission parameters, such as J, Eto, and β versus cathode gap (d), have been established when d is increased from 500 μm to 800 μm. The outstanding properties suggest that the PrB6 products may be promising emitters in the cold-field-emission cathode application.

scholarly journals Conjugated polyelectrolyte nano field emission adlayers

2016 ◽  
Vol 1 (4) ◽  
pp. 304-312 ◽  
Author(s):  
M. T. Cole ◽  
R. J. Parmee ◽  
A. Kumar ◽  
C. M. Collins ◽  
M. H. Kang ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Field Emission ◽  
Electron Emission ◽  
Field Electron Emission ◽  
Conjugated Polyelectrolyte ◽  
Emission Performance ◽  
Field Electron ◽  
Multi Walled Carbon Nanotubes ◽  
Vertically Aligned ◽  
Walled Carbon Nanotubes

Here we report on a straightforward and rapid means of enhancing the field electron emission performance of nascent vertically aligned multi-walled carbon nanotubes by introducing a polar zwitterionic conjugated polyelectrolyte adlayer at the vacuum–emitter interface.

Field Electron Emission from Carbon Nanotube Films on Diamond Films

2005 ◽  
Vol 475-479 ◽  
pp. 3587-3590
Author(s):  
K.J. Liao ◽  
W.L. Wang ◽  
Y.T. Wang ◽  
J.W. Lu ◽  
X.L. Sun
Keyword(s):  
Carbon Nanotubes ◽  
Carbon Nanotube ◽  
Field Emission ◽  
Electron Emission ◽  
Diamond Films ◽  
Chemical Vapour ◽  
Polycrystalline Diamond ◽  
Field Electron Emission ◽  
Field Electron ◽  
Nanotube Films

The field electron emission from carbon nanotube films on polycrystalline diamond films was investigated. The carbon nanotubes and diamond films on Si substrates were prepared by a conventional hot filament chemical vapour deposition. The films obtained were characterized by scanning electron microscopy and Raman spectroscopy. The field emission properties of the samples were measured in an ion-pumped vacuum chamber at a pressure of 10-6 Pa.. The experimental results showed that the field emission behaviours of carbon nanotubes/diomond films structure have greatly been improved as compared with carbon nanotubes and diamond films, respectively. A turn-on field of 1.0 V/µm and a maximum current of 500 µA at 1.5 V/µm were observed, which were lower than those of carbon nanotubes and polycrystalline diamond films, respectively. This improvement was attributed to the tip shape of sample surface, which provided an additional local increase in electric field at the tube ends.

Preparation and Field Emission Characteristics of CNx Nanotubes Thin Film

2005 ◽  
Vol 475-479 ◽  
pp. 3595-3598
Author(s):  
Lan Zhang ◽  
Hui Zhong Ma ◽  
Xue Xiang Li ◽  
Ning Yao ◽  
Bing Lin Zhang
Keyword(s):  
Thin Films ◽  
Field Emission ◽  
Electron Emission ◽  
Photoelectron Spectroscopy ◽  
Microwave Plasma ◽  
Field Electron Emission ◽  
Emission Characteristics ◽  
Flow Ratio ◽  
X Ray ◽  
Field Electron

Carbon nitride nanotubes (CN-NT) thin films were prepared on Ni-Cr coated glass substrate by microwave plasma enhanced chemical vapor deposition at a relatively low temperature of 600～650 °C. The morphology of the films were observed by scanning electron microscopy. The microstructure of the film were analyzed by x-ray photoelectron spectroscopy, x-ray diffraction, and Raman spectroscopy. The characteristics of field emission of CN-NT thin films were measured. Experimental results indicate that the film structure and properties of the field electron emission are related to flow ratio of N2 to CH4. When the flow ratio of N2 to CH4 was 3.3, the obtained film had a better field electron emission characteristics. The turn-on field of the film was 3.7 V/µm . The current density was 413.3 µA/cm2 at an electric field of 8 V/µm.

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