Locally resolved field emission area and its effect on resulting j-E characteristics: Case study for planar thin film ultrananocrystalline diamond field emitters

2017 ◽  
Author(s):  
Oksana Chubenko ◽  
Andrei Afanasev ◽  
Stanislav S. Baturin ◽  
Sergey V. Baryshev
Keyword(s):  
Thin Film ◽  
Field Emission ◽  
Emission Area ◽  
Field Emitters ◽  
Ultrananocrystalline Diamond

scholarly journals Locally Resolved Electron Emission Area and Unified View of Field Emission from Ultrananocrystalline Diamond Films

2017 ◽  
Vol 9 (38) ◽  
pp. 33229-33237 ◽  
Author(s):  
Oksana Chubenko ◽  
Stanislav S. Baturin ◽  
Kiran K. Kovi ◽  
Anirudha V. Sumant ◽  
Sergey V. Baryshev
Keyword(s):  
Field Emission ◽  
Electron Emission ◽  
Diamond Films ◽  
Emission Area ◽  
Ultrananocrystalline Diamond ◽  
Unified View

Novel Method of Growing Ultrananocrystalline Diamond Tips and Their Field Emission Property Study

2008 ◽  
Vol 8 (8) ◽  
pp. 4198-4201 ◽  
Author(s):  
P. T. Joseph ◽  
Li-Ju Chen ◽  
Nyan-Hwa Tai ◽  
Umesh Palnitkar ◽  
Hsiu-Fung Cheng ◽  
...  
Keyword(s):  
Field Emission ◽  
Field Enhancement ◽  
Emission Sources ◽  
Insulating Materials ◽  
Field Emission Properties ◽  
Turn On ◽  
Field Emitters ◽  
Ultrananocrystalline Diamond ◽  
Novel Method

Different forms of diamond have been shown to have qualities as field emission sources. As a consequence, much effort has been focused on both the synthesis of diamond nanostructures to increase the field enhancement factor and understanding the emission mechanism in these nominally insulating materials. In our recent study, we have grown ultrananocrystalline diamond (UNCD) coated nanocrystalline diamond (NCD) tips on NCD films for field emitters. The films were characterized using field emission scanning electron microscopy and Raman spectroscopy to identify the quality of the films. The fabricated different sizes of pyramid tips and their field emission properties are reported. It has been observed that with increase in tip size, the turn on voltage also increases.

scholarly journals Unveiling the Nottingham Inversion Instability during the thermo-field emission from refractory metal micro-protrusions

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Darius Mofakhami ◽  
Benjamin Seznec ◽  
Tiberiu Minea ◽  
Romaric Landfried ◽  
Philippe Testé ◽  
...  
Keyword(s):  
Thermal Conductivity ◽  
Field Emission ◽  
Electron Emission ◽  
Refractory Metal ◽  
Thermal Instability ◽  
Experimental Studies ◽  
Heat Diffusion ◽  
Emission Area ◽  
Field Emitters ◽  
Open Issue

AbstractThe electron emission by micro-protrusions has been studied for over a century, but the complete explanation of the unstable behaviors and their origin remains an open issue. These systems often evolve towards vacuum breakdown, which makes experimental studies of instabilities very difficult. Modeling studies are therefore necessary. In our model, refractory metals have shown the most striking results for discontinuities or jumps recorded on the electron emitted current under high applied voltages. Herein, we provide evidence on the mechanisms responsible for the initiation of a thermal instability during the field emission from refractory metal micro-protrusions. A jump in the emission current at steady state is found beyond a threshold electric field, and it is correlated to a similar jump in temperature. These jumps are related to a transient runaway of the resistive heating that occurs after the Nottingham flux inversion. That causes the hottest region to move beneath the apex, and generates an emerging heat reflux towards the emitting surface. Two additional conditions are required to initiate the runaway. The emitter geometry must ensure a large emission area and the thermal conductivity must be high enough at high temperatures so that the heat reflux can significantly compete with the heat diffusion towards the thermostat. The whole phenomenon, that we propose to call the Nottingham Inversion Instability, can explain unexpected thermal failures and breakdowns observed with field emitters.

Characteristics and Application of Temperature-Field Emitters

1975 ◽  
Vol 33 ◽  
pp. 144-145
Author(s):  
N. Tamura ◽  
T. Goto ◽  
Y. Harada
Keyword(s):  
Temperature Field ◽  
Electron Microscope ◽  
Field Emission ◽  
Resolving Power ◽  
High Brightness ◽  
Field Emitters ◽  
Emission Electron ◽  
Sufficient Stability ◽  
Scanning Electron ◽  
Illuminating System

On account of its high brightness, the field emission electron source has the advantage that it provides the conventional electron microscope with highly coherent illuminating system and that it directly improves the, resolving power of the scanning electron microscope. The present authors have reported some results obtained with a 100 kV field emission electron microscope.It has been proven, furthermore, that the tungsten emitter as a temperature field emission source can be utilized with a sufficient stability under a modest vacuum of 10-8 ~ 10-9 Torr. The present paper is concerned with an extension of our study on the characteristics of the temperature field emitters.

Design of a Field-Emission Gun for the Phillips CM20/STEM microscope

1990 ◽  
Vol 48 (2) ◽  
pp. 100-101
Author(s):  
P.M. Mul ◽  
B.J.M. Bormans ◽  
L. Schaap
Keyword(s):  
High Resolution ◽  
Field Emission ◽  
Analytical Electron Microscopy ◽  
Emission Region ◽  
Attractive Alternative ◽  
Electron Holography ◽  
Field Emitter ◽  
Field Emitters ◽  
Resolution Electron ◽  
High Resolution Tem

The first Field Emission Guns (FEG) on TEM/STEM instruments were introduced by Philips in 1977. In the past decade these EM400-series microscopes have been very successful, especially in analytical electron microscopy, where the high currents in small probes are particularly suitable. In High Resolution Electron Holography, the high coherence of the FEG has made it possible to approach atomic resolution.Most of these TEM/STEM systems are based on a cold field emitter (CFE). There are, however, a number of disadvantages to CFE’s, because of their very small emission region: the maximum current is limited (a strong disadvantage for high-resolution TEM imaging) and the emission is unstable, requiring special measures to reduce the strong FEG-induced noise. Thermal field emitters (TFE), i.e. a zirconiated field emitter source operating in the thermal or Schottky mode, have been shown to be a viable and attractive alternative to CFE’s. TFE’s have larger emission regions, providing much higher maximum currents, better stability, and reduced sensitivity to vacuum conditions as well as mechanical and electrical interferences.

Enhanced Field Emission Properties of Carbon Nanotube Based Field Emitters by Dynamic Oxidation

2013 ◽  
Vol 9 (5) ◽  
pp. 619-623 ◽  
Author(s):  
Shama Parveen ◽  
Samina Husain ◽  
Avshish Kumar ◽  
Javid Ali ◽  
Mubashshir Husain ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Field Emission ◽  
Emission Properties ◽  
Field Emission Properties ◽  
Field Emitters ◽  
Dynamic Oxidation

Enhanced field emission performance of MXene-TiO2 composite film

Nanoscale ◽  
2021 ◽  
Author(s):  
Bingjun Yang ◽  
Jiangtao Chen ◽  
xiaonan Wu ◽  
Bao Liu ◽  
Lingyang Liu ◽  
...  
Keyword(s):  
Composite Film ◽  
Field Emission ◽  
Two Dimensional ◽  
Field Emission Display ◽  
Free Standing ◽  
Emission Performance ◽  
Field Emitters ◽  
Field Emission Performance

A facile method to produce MXene-TiO2 composite is demonstrated for enhanced field emission display applications. The field emission performance of two-dimensional free-standing and linear-shaped field emitters has been systematically investigated...

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