Low-latency optical process-level network based on all-optical edge nodes for sample value service in substations

2018 ◽  
Vol 57 (10) ◽  
pp. 1 ◽  
Author(s):  
Yu Zheng ◽  
Lingyun Di ◽  
Shijie Ma ◽  
Xiaojian Zhang ◽  
Peng Wu ◽  
...  
Keyword(s):  
Low Latency ◽  
Optical Process ◽  
All Optical ◽  
Process Level

scholarly journals All-optical hash code generation and verification for low latency communications

2013 ◽  
Vol 21 (20) ◽  
pp. 23873 ◽  
Author(s):  
Yvan Paquot ◽  
Jochen Schröder ◽  
Mark D. Pelusi ◽  
Benjamin J. Eggleton
Keyword(s):  
Code Generation ◽  
Low Latency ◽  
All Optical ◽  
Hash Code

High-reliability optical process level network in smart substation

2020 ◽  
Vol 36 ◽  
pp. 100552
Author(s):  
Yu Zheng ◽  
Zhiqun Ge ◽  
Xiaolu Zhang ◽  
Jian Xu ◽  
Xiaohan Sun
Keyword(s):  
High Reliability ◽  
Optical Process ◽  
Process Level ◽  
Smart Substation

On-chip all optical error detection for ultra-low latency communications

2013 ◽  
Author(s):  
Yvan Paquot ◽  
Jochen Schröder ◽  
Mark D. Pelusi ◽  
Benjamin J. Eggleton
Keyword(s):  
Error Detection ◽  
Low Latency ◽  
All Optical ◽  
On Chip

Correlation analysis of radiation damage

1978 ◽  
Vol 36 (1) ◽  
pp. 214-215
Author(s):  
R. Hegerl ◽  
A. Feltynowski ◽  
B. Grill
Keyword(s):  
Electron Microscopy ◽  
Independent Random Variables ◽  
Optical Parameters ◽  
Bright Field Image ◽  
Bright Field ◽  
Expectation Value ◽  
All Optical ◽  
Image Element ◽  
Stochastic Series ◽  
The Common

Till now correlation functions have been used in electron microscopy for two purposes: a) to find the common origin of two micrographs representing the same object, b) to check the optical parameters e. g. the focus. There is a third possibility of application, if all optical parameters are constant during a series of exposures. In this case all differences between the micrographs can only be caused by different noise distributions and by modifications of the object induced by radiation.Because of the electron noise, a discrete bright field image can be considered as a stochastic series Pm,where i denotes the number of the image and m (m = 1,.., M) the image element. Assuming a stable object, the expectation value of Pm would be Ηm for all images. The electron noise can be introduced by addition of stationary, mutual independent random variables nm with zero expectation and the variance. It is possible to treat the modifications of the object as a noise, too.

ALL-OPTICAL DIGITAL CIRCUITS

1988 ◽  
Vol 49 (C2) ◽  
pp. C2-459-C2-462 ◽  
Author(s):  
F. A.P. TOOLEY ◽  
B. S. WHERRETT ◽  
N. C. CRAFT ◽  
M. R. TAGHIZADEH ◽  
J. F. SNOWDON ◽  
...  
Keyword(s):  
Digital Circuits ◽  
All Optical

Small Scale and Low Latency Oriented Neural Network Physical Unclonable Function and its Evaluation

2020 ◽  
Vol 140 (12) ◽  
pp. 1297-1306
Author(s):  
Shu Takemoto ◽  
Kazuya Shibagaki ◽  
Yusuke Nozaki ◽  
Masaya Yoshikawa
Keyword(s):  
Neural Network ◽  
Small Scale ◽  
Low Latency ◽  
Physical Unclonable Function
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