Absolute measurements of the reflection coefficients of multilayer x-ray mirrors in the ultrasoft x-ray region

1995 ◽  
Author(s):  
I. I. Lyakhovskaya
Keyword(s):  
Reflection Coefficients ◽  
X Ray ◽  
Absolute Measurements

X-Ray Spectrometric Properties of Potassium Acid Phthalate Crystals

1969 ◽  
Vol 13 ◽  
pp. 373-381 ◽  
Author(s):  
R. J. Liefeld ◽  
S. Hanzgly ◽  
T. B. Kirby ◽  
D. Mott
Keyword(s):  
Oxygen Atom ◽  
Energy Range ◽  
Energy Resolution ◽  
Reflection Coefficients ◽  
X Ray ◽  
First Order ◽  
Coefficient Of Reflection ◽  
Potassium Acid Phthalate ◽  
Order Parallel ◽  
Acid Phthalate

The results of two crystal measurements of potassium acid phthalate crystal first order parallel position rocking curves, percent reflections, and reflection coefficients are presented. They cover the 4-24 Ǻ wavelength range and are typical of results with cleaved crystals illuminated over areas of one-half to two square inches. The energy resolution available with these crystals is shown to be nearly constant at about two-thirds of an electron volt over most of the energy range studied and the coefficient of reflection is also nearly constant at about 1 x 10-4 radians. A pronounced line-like reflectivity structure at 23.3 Ǻ is exhibited which is probably associated with oxygen atom K-shell absorption.

scholarly journals Absolute brightness measurements at the LURE synchrotron with a bolometer and application to the absolute calibration of photodiodes and photocathodes

1994 ◽  
Vol 12 (3) ◽  
pp. 573-583 ◽  
Author(s):  
C. Reverdin ◽  
P. Troussel ◽  
F. Le Guern ◽  
J.L. Bourgade ◽  
D. Schirmann ◽  
...  
Keyword(s):  
Low Noise ◽  
Beam Line ◽  
Absolute Calibration ◽  
Density Measurements ◽  
X Ray ◽  
Laser Plasma Interaction ◽  
Absolute Measurements ◽  
Power Densities ◽  
Adequate Data ◽  
Absolute Brightness

An electrically calibrated bolometer designed to measure VUV and soft X-ray radiation in tokamaks was installed at the end of the calibration beam line used by CEL-V at the LURE synchrotron. Low-noise electronics and an adequate data acquisition enabled absolute measurements of power densities as low as 1 μW/cm2. Power density measurements are presented. At the same location several soft X-ray detectors used in laser-plasma interaction studies were installed and their absolute calibration was performed (photocathodes, photodiodes, etc.). Calibration results are presented and compared with a Henke model for photocathode response.

Measurements of anomalous dispersion made with X-ray interferometers

1981 ◽  
Vol 376 (1766) ◽  
pp. 465-482 ◽  
Keyword(s):  
Satisfactory Agreement ◽  
Absorption Edge ◽  
Anomalous Dispersion ◽  
Wavelength Band ◽  
Systematic Comparison ◽  
X Ray ◽  
Computational Errors ◽  
Computer Controlled ◽  
Absolute Measurements ◽  
Theory And Experiment

Absolute measurements of the anomalous dispersion constants f ' for zirconium, niobium and molybdenum made with a computer controlled X-ray interferometer have achieved a precision that permits systematic comparison with the available theories. Measurements were made at about 80 wavelengths within ± 3 keV of the elements’ K-absorption edge. After modification, to minimize computational errors, the theory of Cromer and Liberman is in satisfactory agreement with the results obtained so far, but small systematic differences between theory and experiment are apparent. Further work on a wide variety of elements and over a wide wavelength band is in progress.

Accurate X-ray Absorption Spectra of Dilute Systems: Absolute Measurements and Structural Analysis of Ferrocene and Decamethylferrocene

2016 ◽  
Vol 120 (17) ◽  
pp. 9399-9418 ◽  
Author(s):  
M. T. Islam ◽  
S. P. Best ◽  
J. D. Bourke ◽  
L. J. Tantau ◽  
C. Q. Tran ◽  
...  
Keyword(s):  
Structural Analysis ◽  
Absorption Spectra ◽  
X Ray ◽  
Absolute Measurements ◽  
X Ray Absorption

The electron distribution in silicon - I. Experiment

1973 ◽  
Vol 332 (1589) ◽  
pp. 223-238 ◽  
Keyword(s):  
Internal Consistency ◽  
Electron Distribution ◽  
X Ray ◽  
Structure Factors ◽  
Absolute Measurements

We have completed absolute measurements of the X-ray structure factors of silicon by the Pendellösung method using the techniques developed by Hart & Milne (1969). The 111, 220, 311, 400, 331, 422, 333, 511, 440, 444, 642, 660, 555, 844 and 880 reflexions were all measured in the symmetric Laue case with both MoKα 1 , and AgKα 1 radiations and at 92.2 and 293.2 K. The internal consistency of the results indicates that probable errors of order 0.1% are realistic.

Layered Synthetic Microstructures as Dispersing Devices in X-ray Spectrometers

1982 ◽  
Vol 36 (1) ◽  
pp. 58-61 ◽  
Author(s):  
J. V. Gilfrich ◽  
D. J. Nagel ◽  
T. W. Barbee
Keyword(s):  
Transition Metal ◽  
Wavelength Region ◽  
Resolving Power ◽  
Reflection Coefficients ◽  
Layer Spacing ◽  
X Ray ◽  
Long Wavelength ◽  
High Diffraction Efficiency ◽  
High Diffraction ◽  
Synthetic Microstructures

Layered synthetic microstructures (LSM's) are useful dispersing devices for x-ray spectroscopy. They can be produced with virtually any layer spacing ( d) greater than approximately 10 Å and they have high diffraction efficiency. Integral reflection coefficients for such structures made up of alternating layers of a transition metal and carbon are 3 to 10 times greater than values for other dispersing elements used in the moderate to long wavelength region of the x-ray spectrum. Resolving power of the LSMs is somewhat poorer than crystals at this time but is sufficient to permit significant applications.

scholarly journals Phase determination of x-ray reflection coefficients

2000 ◽  
Vol 62 (15) ◽  
pp. 10377-10382 ◽  
Author(s):  
K.-M. Zimmermann ◽  
M. Tolan ◽  
R. Weber ◽  
J. Stettner ◽  
A. K. Doerr ◽  
...  
Keyword(s):  
Reflection Coefficients ◽  
Phase Determination ◽  
X Ray

Three-wave X-ray diffraction: an analysis scheme of the sensitivity in determining triplet phase invariants

1999 ◽  
Vol 55 (4) ◽  
pp. 683-694 ◽  
Author(s):  
Yuri P. Stetsko ◽  
Shih-Lin Chang
Keyword(s):  
Incident Wave ◽  
Polarization State ◽  
Reflection Coefficients ◽  
Phase Sensitivity ◽  
X Ray Diffraction ◽  
Phase Determination ◽  
X Ray ◽  
Diffraction Geometry ◽  
Analysis Scheme ◽  
Diffracted Waves

A model for analysing the phase sensitivity of the reflection coefficients of a diffracted wave in the case of three-wave X-ray diffraction is proposed. This model considers three-wave diffraction as the interference of the directly excited and the Umweg-excited diffracted waves and seems to account properly for the phase sensitivity as well as the behaviour of an involved diffracted wave as a function of the triplet phase invariant, the polarization state of the incident wave and the diffraction geometry. The practical issues for phase determination are also considered.

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