scholarly journals Ultra fine measurement of the effect of a vacuum exposure on the central wavelength of narrow-bandpass interference filters manufactured by dual ion beam sputtering

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Frédéric Lemarquis ◽  
Morgan Boucanssot ◽  
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2014 ◽  
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Shruti Verma ◽  
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2007 ◽  
Vol 61 (14-15) ◽  
pp. 2855-2858 ◽  
Author(s):  
J.P. Rivière ◽  
D. Texier ◽  
J. Delafond ◽  
M. Jaouen ◽  
E.L. Mathé ◽  
...  

2021 ◽  
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Jinlin Bai ◽  
Huasong Liu ◽  
Yugang Jiang ◽  
Lishuan Wang ◽  
Xiao Yang ◽  
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2005 ◽  
Vol 478 (1-2) ◽  
pp. 116-120 ◽  
Author(s):  
Jae Kwon Kim ◽  
Kyu Man Cha ◽  
Jung Hyun Kang ◽  
Yong Kim ◽  
Jae-Yel Yi ◽  
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1993 ◽  
Vol 223 (1) ◽  
pp. 11-13 ◽  
Author(s):  
Yijie Li ◽  
Guangcheng Xiong ◽  
Guijun Lian ◽  
Jie Li ◽  
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1987 ◽  
Vol 61 (12) ◽  
pp. 5480-5483 ◽  
Author(s):  
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Shigekazu Ootomo ◽  
Noriyuki Kumasaka

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