Ultra fine measurement of the effect of a vacuum exposure on the central wavelength of narrow-bandpass interference filters manufactured by dual ion beam sputtering
Keyword(s):
Ion Beam
◽
Dual Ion Beam Sputtering for Chromium Nitride as an Alternative to Electroplated Hexavalent Chromium
2005 ◽
pp. 301-304
Keyword(s):
Ion Beam
◽