Combining spectroscopic ellipsometry with transmission spectroscopy to derive accurate optical constants for organic materials

2021 ◽  
Author(s):  
Michael O. Yokosuk ◽  
Thomas E. Tiwald ◽  
Danielle L. Saunders ◽  
Thomas A. Blake ◽  
Timothy J. Johnson ◽  
...  
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Organic Materials ◽  
Transmission Spectroscopy

Determination of optical constants of solgel-derived inhomogeneous TiO_2 thin films by spectroscopic ellipsometry and transmission spectroscopy

1998 ◽  
Vol 37 (4) ◽  
pp. 691 ◽  
Author(s):  
Md. Mosaddeq-ur-Rahman ◽  
Guolin Yu ◽  
Kalaga Murali Krishna ◽  
Tetsuo Soga ◽  
Junji Watanabe ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Transmission Spectroscopy

Optical constants of DC magnetron sputtered titanium dioxide thin films measured by spectroscopic ellipsometry

2003 ◽  
Vol 38 (9) ◽  
pp. 773-778 ◽  
Author(s):  
B. Karunagaran ◽  
R. T. Rajendra Kumar ◽  
C. Viswanathan ◽  
D. Mangalaraj ◽  
Sa. K. Narayandass ◽  
...  
Keyword(s):  
Thin Films ◽  
Titanium Dioxide ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Titanium Dioxide Thin Films

scholarly journals Determination of the Thickness and Optical Constants of ZrO2 by Spectroscopic Ellipsometry and Spectrophotometric Method

2011 ◽  
Vol 8 ◽  
pp. 223-227 ◽  
Author(s):  
R. Yusoh ◽  
M. Horprathum ◽  
P. Eiamchai ◽  
S. Chanyawadee ◽  
K. Aiempanakit
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Spectrophotometric Method ◽  
Optical Constants

Detection of an ordered-structure fraction in amorphous silicon

2016 ◽  
Vol 49 (2) ◽  
pp. 528-532 ◽  
Author(s):  
Xiao-Dong Wang ◽  
Bo Chen ◽  
Hai-Feng Wang ◽  
Xin Zheng ◽  
Shi-Jie Liu ◽  
...  
Keyword(s):  
Magnetron Sputtering ◽  
Radio Frequency ◽  
Amorphous Silicon ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Ordered Structure ◽  
Radio Frequency Magnetron Sputtering ◽  
Medium Range Order ◽  
Medium Range ◽  
Si Films

Amorphous silicon (a-Si) films were prepared by radio frequency magnetron sputtering. Spectroscopic ellipsometry (SE) was utilized to detect an ordered-structure fraction in a-Si. The SE analysis of a-Si films with different thicknesses (7.0–140.0 nm) demonstrates that no more than 2.81% of medium-range order exists in the samples, and interestingly, there is a thickness dependence of optical constants for a-Si in the range of 1.5–5.0 eV.

Eagle XG® glass: Optical constants from 196 to 1688 nm (0.735–6.33 eV) by spectroscopic ellipsometry

2017 ◽  
Vol 24 (2) ◽  
pp. 026001 ◽  
Author(s):  
Cody V. Cushman ◽  
Brian I. Johnson ◽  
Andrew Martin ◽  
Barry M. Lunt ◽  
Nicholas J. Smith ◽  
...  
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Optical Constants

Optical constants of MOCVD-grown Aurivillius phases in the Bi4Ti3O12–Na0.5Bi0.5TiO3 system measured by spectroscopic ellipsometry

2011 ◽  
Vol 105 (1) ◽  
pp. 81-88 ◽  
Author(s):  
S. Bin Anooz ◽  
J. Schwarzkopf ◽  
P. Petrik ◽  
M. Schmidbauer ◽  
A. Duk ◽  
...  
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Aurivillius Phases

Ellipsometric study of the complex optical constants of a CsPbBr3 perovskite thin film

2018 ◽  
Vol 6 (39) ◽  
pp. 10450-10455 ◽  
Author(s):  
Minglin Zhao ◽  
Yujun Shi ◽  
Jun Dai ◽  
Jie Lian
Keyword(s):  
Thin Film ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Interband Transitions ◽  
Hybrid Perovskite ◽  
Ellipsometric Study

Complex optical constants and interband transitions of a hybrid perovskite CsPbBr3 thin film measured by spectroscopic ellipsometry.

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