scholarly journals Proton-induced degradation of charge transfer efficiency on FLEX CCD detectors: measurement and impact on instrument performances

Author(s):  
François Bernard ◽  
Matej Arko ◽  
Thibaut Prod'homme ◽  
Frédéric Lemmel ◽  
Toncho Ivanov ◽  
...  
1998 ◽  
Vol 45 (2) ◽  
pp. 154-163 ◽  
Author(s):  
T. Hardy ◽  
R. Murowinski ◽  
M.J. Deen

RSC Advances ◽  
2018 ◽  
Vol 8 (25) ◽  
pp. 13891-13897 ◽  
Author(s):  
Pingge He ◽  
Qiangqiang Zhang ◽  
Qun Huang ◽  
Boyun Huang ◽  
Tengfei Chen

Vertically-oriented graphene nanosheet as nano-bridge for pseudocapacitive electrode facilitates the ion/charge transfer efficiency, leading to ultrahigh electrochemical stability.


Author(s):  
Zujun Wang ◽  
Shaoyan Huang ◽  
Minbo Liu ◽  
Benqi Tang ◽  
Zhigang Xiao ◽  
...  

The mechanisms of charge coupled devices (CCD) irradiated by protons are analyzed. The simulation models of ionization damage and displacement damage are developed. The charge transfer efficiency (CTE) decreased by proton irradiation is numerically simulated. The CTE degradation caused by different traps and by protons with different energies has been studied respectively. Both surface dark signals induced by proton ionization damage and bulk dark signals induced by proton displacement damage are numerically simulated. The variability of surface dark signals, bulk dark signals, and total dark signals with proton fluence is compared. The simulation results are in agreement with the experimental results of the relevant literatures.


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