Simulation of the electron-optical system of the MIS-I electron-beam multicharged ion

2003 ◽  
Author(s):  
V. G. Abdul'manov ◽  
P. D. Voblyi ◽  
A. V. Utkin ◽  
V. P. Tomilov ◽  
Yu. N. Yudin ◽  
...  
2016 ◽  
Vol 42 (7) ◽  
pp. 713-717 ◽  
Author(s):  
A. A. Grishkov ◽  
S. Yu. Kornilov ◽  
N. G. Rempe ◽  
S. V. Shidlovskiy ◽  
V. A. Shklyaev

2020 ◽  
pp. 92-93
Author(s):  
P.A. Martynenko

Based on the tube method, taking into account the three second law for the current in each tube, the program EL&ION for preliminary rapid numerical analysis of the electron-optical system was developed, using which the system was developed for generating an ion beam of reactive gases with an energy of up to 50 keV and a current of 10...20 mA in the presence of high-density electron beam.


2004 ◽  
Author(s):  
V. G. Abdul'manov ◽  
P. D. Voblyi ◽  
P. V. Nevskii

2021 ◽  
Vol 28 (12) ◽  
pp. 123101
Author(s):  
PengCheng Yin ◽  
Jin Xu ◽  
ShuanZhu Fang ◽  
RuiChao Yang ◽  
JinJing Luo ◽  
...  

Author(s):  
Michel Troyonal ◽  
Huei Pei Kuoal ◽  
Benjamin M. Siegelal

A field emission system for our experimental ultra high vacuum electron microscope has been designed, constructed and tested. The electron optical system is based on the prototype whose performance has already been reported. A cross-sectional schematic illustrating the field emission source, preaccelerator lens and accelerator is given in Fig. 1. This field emission system is designed to be used with an electron microscope operated at 100-150kV in the conventional transmission mode. The electron optical system used to control the imaging of the field emission beam on the specimen consists of a weak condenser lens and the pre-field of a strong objective lens. The pre-accelerator lens is an einzel lens and is operated together with the accelerator in the constant angular magnification mode (CAM).


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