Compact spectrometer modeling based on wavelength-scale stationary wave Fourier transform in integrated optic

2008 ◽  
Author(s):  
Alain Morand ◽  
Guillaume Custillon ◽  
Pierre Benech ◽  
Etienne Le Coarer ◽  
Gregory Leblond ◽  
...  
Keyword(s):  
Fourier Transform ◽  
Stationary Wave ◽  
Wavelength Scale

scholarly journals Wavelength-scale stationary-wave integrated Fourier-transform spectrometry

2007 ◽  
Vol 1 (8) ◽  
pp. 473-478 ◽  
Author(s):  
Etienne le Coarer ◽  
Sylvain Blaize ◽  
Pierre Benech ◽  
Ilan Stefanon ◽  
Alain Morand ◽  
...  
Keyword(s):  
Fourier Transform ◽  
Stationary Wave ◽  
Fourier Transform Spectrometry ◽  
Wavelength Scale

Stationary Wave Integrated Fourier Transform Spectrometer (SWIFTS)

2010 ◽  
Author(s):  
Jérôme Ferrand ◽  
Guillaume Custillon ◽  
Gregory Leblond ◽  
Fabrice Thomas ◽  
Thibault Moulin ◽  
...  
Keyword(s):  
Fourier Transform ◽  
Stationary Wave ◽  
Fourier Transform Spectrometer

Major advances in developments and algorithms of the Stationary-Wave Integrated Fourier-Transform technology

2016 ◽  
Author(s):  
F. Thomas ◽  
B. Martin ◽  
C. Duchemin ◽  
R. Puget ◽  
E. Morino ◽  
...  
Keyword(s):  
Fourier Transform ◽  
Stationary Wave

An RF spectrometer for fast wide band measurement

2009 ◽  
Vol 1 (6) ◽  
pp. 537-542 ◽  
Author(s):  
Simon Hemour ◽  
Florence Podevin ◽  
Pascal Xavier
Keyword(s):  
Fourier Transform ◽  
Standing Wave ◽  
Short Circuit ◽  
Wide Band ◽  
Stationary Wave ◽  
Fourier Transform Spectrometer ◽  
Wideband Signals ◽  
New Type ◽  
5 Ghz ◽  
Proof Of Principle

A new type of spectrum analyzer using RF interferometry is presented. The stationary wave integrated Fourier transform spectrometer is dedicated to the measurement of transient wideband signals. The spectrometer is mobile and cheap. It consists of spatial samplers placed along a waveguide ended by a short circuit. The standing wave caused by the short circuit is sampled and the spectrum is obtained by an FFT computation. A 0.3–5 GHz analyzer was built as a proof-of-principle demonstration and an application to RF dosimetry is shown.

Development of Kinetic Inductance Stationary-Wave Integrated Fourier-Transform Spectrometry (SWIFTS)

2012 ◽  
Vol 167 (3-4) ◽  
pp. 386-391 ◽  
Author(s):  
N. Boudou ◽  
A. Monfardini ◽  
C. Hoffmann ◽  
F. Podevin ◽  
P. Xavier ◽  
...  
Keyword(s):  
Fourier Transform ◽  
Stationary Wave ◽  
Kinetic Inductance ◽  
Fourier Transform Spectrometry

Calibration and data reduction of a Stationary Wave Integrated Fourier Transform Spectrometer (SWIFTS)

2009 ◽  
Author(s):  
J. Ferrand ◽  
G. Custillon ◽  
P. Benech ◽  
A. Morand ◽  
E. Le Coarer
Keyword(s):  
Fourier Transform ◽  
Data Reduction ◽  
Stationary Wave ◽  
Fourier Transform Spectrometer

scholarly journals Dual Tunable MZIs Stationary-Wave Integrated Fourier Transform Spectrum Detection

Sensors ◽  
2021 ◽  
Vol 21 (7) ◽  
pp. 2352
Author(s):  
Xinyang Chen ◽  
Peijian Huang ◽  
Ning Wang ◽  
Yong Zhu ◽  
Jie Zhang
Keyword(s):  
Fourier Transform ◽  
Signal Reconstruction ◽  
Stationary Wave ◽  
Optical Path Difference ◽  
Path Difference ◽  
High Spectral Resolution ◽  
Reconstruction Method ◽  
Gold Nanowires ◽  
Spectrum Reconstruction ◽  
Under Sampling

In order to resolve spectral alias due to under sampling in traditional stationary-wave integrated Fourier transform (SWIFT) spectrometers, an all-on-chip waveguide based on dual tunable Mach-Zehnder interferometer (MZI) stationary-wave integrated Fourier transform technology (DTM-SWIFT) is proposed. Several gold nanowires are asymmetrically positioned at two sides of zero optical path difference and scatter the interference fringes information, which can avoid aliasing of spectral signals and help to gain high spectral resolution. A systematic theoretical analysis is carried on in detail, including the optical distribution characteristics based on multi-beam interference, stationary-wave theorem and signal reconstruction method based on the FT technology. The results show that the method can complete a resolution of 6 nm for Gauss spectrum reconstruction using only 6 gold nanowires, and a resolution of 5 cm−1 for Raman spectrum reconstruction using 25 gold nanowires.

Comparison of Calculated and Recorded Electron Energy-Loss Spectra of Aluminium and Carbon

1990 ◽  
Vol 48 (2) ◽  
pp. 64-65
Author(s):  
L. Reimer ◽  
R. Oelgeklaus
Keyword(s):  
Fourier Transform ◽  
Energy Loss ◽  
Electron Energy ◽  
Rotational Symmetry ◽  
Mean Free Path ◽  
Single Scattering ◽  
Specimen Thickness ◽  
Two Dimensional ◽  
Image Position ◽  
Electron Energy Loss

Quantitative electron energy-loss spectroscopy (EELS) needs a correction for the limited collection aperture α and a deconvolution of recorded spectra for eliminating the influence of multiple inelastic scattering. Reversely, it is of interest to calculate the influence of multiple scattering on EELS. The distribution f(w,θ,z) of scattered electrons as a function of energy loss w, scattering angle θ and reduced specimen thickness z=t/Λ (Λ=total mean-free-path) can either be recorded by angular-resolved EELS or calculated by a convolution of a normalized single-scattering function ϕ(w,θ). For rotational symmetry in angle (amorphous or polycrystalline specimens) this can be realised by the following sequence of operations :(1)where the two-dimensional distribution in angle is reduced to a one-dimensional function by a projection P, T is a two-dimensional Fourier transform in angle θ and energy loss w and the exponent -1 indicates a deprojection and inverse Fourier transform, respectively.

FR-IR Molecular Microanalysis System

1990 ◽  
Vol 48 (2) ◽  
pp. 270-271
Author(s):  
John A. Reffner ◽  
William T. Wihlborg
Keyword(s):  
Fourier Transform ◽  
Fourier Transform Infrared ◽  
Integrated System ◽  
Morphological Examination ◽  
Fully Integrated ◽  
Ir Microscopy ◽  
Normal Functions ◽  
Infrared Microspectroscopy ◽  
Infrared Spectral ◽  
Ft Ir

The IRμs™ is the first fully integrated system for Fourier transform infrared (FT-IR) microscopy. FT-IR microscopy combines light microscopy for morphological examination with infrared spectroscopy for chemical identification of microscopic samples or domains. Because the IRμs system is a new tool for molecular microanalysis, its optical, mechanical and system design are described to illustrate the state of development of molecular microanalysis. Applications of infrared microspectroscopy are reviewed by Messerschmidt and Harthcock.Infrared spectral analysis of microscopic samples is not a new idea, it dates back to 1949, with the first commercial instrument being offered by Perkin-Elmer Co. Inc. in 1953. These early efforts showed promise but failed the test of practically. It was not until the advances in computer science were applied did infrared microspectroscopy emerge as a useful technique. Microscopes designed as accessories for Fourier transform infrared spectrometers have been commercially available since 1983. These accessory microscopes provide the best means for analytical spectroscopists to analyze microscopic samples, while not interfering with the FT-IR spectrometer’s normal functions.

The extended Fourier algorithm: Application in discrete optics and electron holography

1994 ◽  
Vol 52 ◽  
pp. 918-919
Author(s):  
E. Voelkl ◽  
L. F. Allard
Keyword(s):  
Fourier Transform ◽  
Fourier Transforms ◽  
Sampling Rate ◽  
Electron Holography ◽  
Optical Bench ◽  
Fourier Space ◽  
Ccd Cameras ◽  
Simulated Image ◽  
Initial Sampling ◽  
Fourier Algorithm

The conventional discrete Fourier transform can be extended to a discrete Extended Fourier transform (EFT). The EFT allows to work with discrete data in close analogy to the optical bench, where continuous data are processed. The EFT includes a capability to increase or decrease the resolution in Fourier space (thus the argument that CCD cameras with a higher number of pixels to increase the resolution in Fourier space is no longer valid). Fourier transforms may also be shifted with arbitrary increments, which is important in electron holography. Still, the analogy between the optical bench and discrete optics on a computer is limited by the Nyquist limit. In this abstract we discuss the capability with the EFT to change the initial sampling rate si of a recorded or simulated image to any other(final) sampling rate sf.

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