The new approach in the determination of the dependency of surface charge density on semiconductor surface potential based voltage: capacity analysis of the depletion region of MIS-structures
1995 ◽
Vol 171
(2)
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pp. 525-527
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2015 ◽
Vol 36
(12)
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pp. 1742-1747
1987 ◽
Vol 117
(2)
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pp. 570-573
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Keyword(s):
2021 ◽
1998 ◽
Vol 200
(2)
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pp. 291-297
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1986 ◽
Vol 110
(2)
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pp. 556-560
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2012 ◽
Vol 385
(1)
◽
pp. 218-224
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Keyword(s):
1990 ◽
Vol 21
(1-2)
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pp. 125-136
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1996 ◽
Vol 108
(1)
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pp. 27-31
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