<title>Design, Fabrication And Performance Of Two Grazing Incidence Telescopes For Celestial Extreme Ultraviolet Astronomy</title>

AbstractWe have fabricated solution-processed thin films of pentacene by casting solution on a substrate and vaporizing solvent. The films with large oriented platelet domains were obtained by directionally grown condition. Molecular alignment in the directionally grown grains has been studied by several kinds of structural analysis. Oriented domains with the width of several hundreds microns and the length in an order of cm of the films were confirmed by polarized microscopy. In-plane crystalline structure of the domain has been studied by grazing incidence X-ray diffraction (GIXD) and strong anisotropy of in-plane crystalline structure was confirmed. Crystalline growth direction of the film was determined to be b-axis from both transmission electron diffraction and GIXD. Thin films transistors (TFTs) with directionally oriented domains of the films were fabricated on electrode patterned substrate. The observed maximum carrier mobility of 2.7 cm2/Vs was comparable to that of single crystal, which indicated that the quality of the film was almost identical with the single crystal. Correlation between FET performance and growth direction was studied and preferred performance of TFTs with the film grown perpendicularly to the channel was observed.

Download Full-text

Design and performance analysis of multilayer nested grazing incidence optics

10.1117/12.2067007 ◽

2014 ◽

Author(s):

Fuchang Zuo ◽

Loulou Deng ◽

Zhiwu Mei ◽

Liansheng Li ◽

Zhengxin Lv

Keyword(s):

Performance Analysis ◽

Grazing Incidence ◽

Grazing Incidence Optics ◽

And Performance

Download Full-text

Aplanatic grazing incidence x-ray microscopes: design and performance

Applied Optics ◽

10.1364/ao.15.003094 ◽

1976 ◽

Vol 15 (12) ◽

pp. 3094 ◽

Cited By ~ 7

Author(s):

Richard C. Chase

Keyword(s):

Grazing Incidence ◽

X Ray ◽

And Performance

Download Full-text

Design and Performance of the X-ray Polarimeter X-Calibur

Journal of Astronomical Instrumentation ◽

10.1142/s225117171440008x ◽

2014 ◽

Vol 03 (02) ◽

pp. 1440008 ◽

Cited By ~ 18

Author(s):

M. Beilicke ◽

F. Kislat ◽

A. Zajczyk ◽

Q. Guo ◽

R. Endsley ◽

...

Keyword(s):

Gamma Ray ◽

Detection Efficiency ◽

Grazing Incidence ◽

High Energy ◽

X Rays ◽

Field Orientation ◽

Synchrotron Source ◽

X Ray ◽

And Performance ◽

Detector Assembly

X-ray polarimetry promises to give qualitatively new information about high-energy astrophysical sources, such as binary black hole systems, micro-quasars, active galactic nuclei, neutron stars, and gamma-ray bursts. We designed, built and tested a X-ray polarimeter, X-Calibur, to be used in the focal plane of the balloon-borne InFOCμS grazing incidence X-ray telescope. X-Calibur combines a low-Z scatterer with a Cadmium Zinc Telluride (CZT) detector assembly to measure the polarization of 20–80 keV X-rays making use of the fact that polarized photons scatter preferentially perpendicular to the electric field orientation. X-Calibur achieves a high detection efficiency of ≃80%. The X-Calibur detector assembly is completed, tested, and fully calibrated. The response to a polarized X-ray beam was measured successfully at the Cornell High Energy Synchrotron Source. This paper describes the design, calibration and performance of the X-Calibur polarimeter. In principle, a similar space-borne scattering polarimeter could operate over the broader 2–100 keV energy band.

Download Full-text

Single-channel method for measuring the reflectance spectra of grazing incidence mirrors in the extreme ultraviolet range

Optics Letters ◽

10.1364/ol.44.004949 ◽

2019 ◽

Vol 44 (20) ◽

pp. 4949

Author(s):

D. B. Abramenko ◽

P. S. Antsiferov ◽

L. A. Dorokhin ◽

V. V. Medvedev ◽

Yu. V. Sidelnikov ◽

...

Keyword(s):

Single Channel ◽

Extreme Ultraviolet ◽

Grazing Incidence ◽

Reflectance Spectra ◽

Ultraviolet Range

Download Full-text

Alignment of the aberration-free XUV Raman spectrometer at FLASH

Journal of Synchrotron Radiation ◽

10.1107/s160057751801576x ◽

2019 ◽

Vol 26 (1) ◽

pp. 18-27 ◽

Cited By ~ 1

Author(s):

Mykola Biednov ◽

Günter Brenner ◽

Benjamin Dicke ◽

Holger Weigelt ◽

Barbara Keitel ◽

...

Keyword(s):

Extreme Ultraviolet ◽

Laser Interferometry ◽

Grazing Incidence ◽

Stray Light ◽

Optical Scheme ◽

Optical Elements ◽

X Ray ◽

Raman Spectrometer ◽

Optical Alignment

An extreme-ultraviolet (XUV) double-stage Raman spectrometer is permanently installed as an experimental end-station at the PG1 beamline of the soft X-ray/XUV free-electron laser in Hamburg, FLASH. The monochromator stages are designed according to the Czerny–Turner optical scheme, adapted for the XUV photon energy range, with optical elements installed at grazing-incidence angles. Such an optical scheme along with the usage of off-axis parabolic mirrors for light collimation and focusing allows for aberration-free spectral imaging on the optical axis. Combining the two monochromators in additive dispersion mode allows for reaching high resolution and superior stray light rejection, but puts high demands on the quality of the optical alignment. In order to align the instrument with the highest precision and to quantitatively characterize the instrument performance and thus the quality of the alignment, optical laser interferometry, Hartmann–Shack wavefront-sensing measurements as well as off-line soft X-ray measurements and extensive optical simulations were conducted. In this paper the concept of the alignment scheme and the procedure of the internal optical alignment are presented. Furthermore, results on the imaging quality and resolution of the first monochromator stage are shown.

Download Full-text