TH-D-352-09: A High Precision, High Throughput Fixture for Routine Spatial Characterization of the Xoft Axxent™ Miniature X-Ray Source

2008 ◽  
Vol 35 (6Part27) ◽  
pp. 2995-2995
Author(s):  
L Kelley ◽  
S Axelrod ◽  
M Powell
2021 ◽  
Vol 8 (1) ◽  
Author(s):  
Yiming Chen ◽  
Chi Chen ◽  
Chen Zheng ◽  
Shyam Dwaraknath ◽  
Matthew K. Horton ◽  
...  

AbstractThe L-edge X-ray Absorption Near Edge Structure (XANES) is widely used in the characterization of transition metal compounds. Here, we report the development of a database of computed L-edge XANES using the multiple scattering theory-based FEFF9 code. The initial release of the database contains more than 140,000 L-edge spectra for more than 22,000 structures generated using a high-throughput computational workflow. The data is disseminated through the Materials Project and addresses a critical need for L-edge XANES spectra among the research community.


Author(s):  
L. I. Goray ◽  
E. V. Pirogov ◽  
M. V. Svechnikov ◽  
M. S. Sobolev ◽  
N. K. Polyakov ◽  
...  

2011 ◽  
Vol 21 (6) ◽  
pp. 898-907 ◽  
Author(s):  
W. Shi ◽  
M. Punta ◽  
J. Bohon ◽  
J. M. Sauder ◽  
R. D'Mello ◽  
...  

Methods ◽  
2011 ◽  
Vol 55 (4) ◽  
pp. 342-349 ◽  
Author(s):  
Jeremiah S. Joseph ◽  
Wei Liu ◽  
Joshua Kunken ◽  
Thomas M. Weiss ◽  
Hiro Tsuruta ◽  
...  

2014 ◽  
Vol 21 (6) ◽  
pp. 1367-1369 ◽  
Author(s):  
Weihe Xu ◽  
Kenneth Lauer ◽  
Yong Chu ◽  
Evgeny Nazaretski

A rotational stage is a key component of every X-ray instrument capable of providing tomographic or diffraction measurements. To perform accurate three-dimensional reconstructions, runout errors due to imperfect rotation (e.g.circle of confusion) must be quantified and corrected. A dedicated instrument capable of full characterization and circle of confusion mapping in rotary stages down to the sub-10 nm level has been developed. A high-stability design, with an array of five capacitive sensors, allows simultaneous measurements of wobble, radial and axial displacements. The developed instrument has been used for characterization of two mechanical stages which are part of an X-ray microscope.


2013 ◽  
Vol 3 (1) ◽  
Author(s):  
Andreas Schropp ◽  
Robert Hoppe ◽  
Vivienne Meier ◽  
Jens Patommel ◽  
Frank Seiboth ◽  
...  

2004 ◽  
Vol 78 (1) ◽  
pp. 53-58 ◽  
Author(s):  
U. Vogt ◽  
R. Frueke ◽  
T. Wilhein ◽  
H. Stollberg ◽  
P.A.C. Jansson ◽  
...  

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