Silicon Drift Detectors’ Spectroscopic Response during the SIDDHARTA-2 Kaonic Helium Run at the DAΦNE Collider

A large-area silicon drift detectors (SDDs) system has been developed by the SIDDHARTA-2 collaboration for high precision light kaonic atom X-ray spectroscopy at the DAΦNE collider of Istituto Nazionale di Fisica Nucleare—Laboratori Nazionali di Frascati. The SDDs’ geometry and electric field configuration, combined with their read-out electronics, make these devices suitable for performing high precision light kaonic atom spectroscopy measurements in the background of the DAΦNE collider. This work presents the spectroscopic response of the SDDs system during the first exotic atoms run of SIDDHARTA-2 with kaonic helium, a preliminary to the kaonic deuterium data taking campaign. The SIDDHARTA-2 spectroscopic system has good energy resolution and a 2 μs timing window which rejects the asynchronous events, scaling the background by a factor of 10−5. The results obtained for the first exotic atoms run of SIDDHARTA-2 prove this system to be ready to perform the challenging kaonic deuterium measurement.

Electron spectrometry with Silicon drift detectors: a GEANT4 based method for detector response reconstruction

Precision electron spectrometry in the keV range has always been considered a challenging task. The reconstruction of the original electron energy from the detected signal is not trivial because multiple effects modify the kinetic energy of the electron along its path. If not correctly accounted for, these effects can spoil and bias the reconstructed energy with a dramatic reduction of accuracy and precision. In this paper we address one of the most critical aspects of electron spectrometry: the generally unknown effect of the detector entrance window. We show that, with a MonteCarlo-based approach, we are able to build a model of the entrance window accurate enough to reduce the negative effects due to its existence. We adopt for this purpose Silicon Drift Detectors that, thought primarily used for X-ray spectrometry, appear a promising device for electron spectrometry. The technique we discuss exploits characterization and validation measurements performed with electron beams from a Scanning Electron Microscope, later reconstructed with a GEANT4 MonteCarlo simulation.