SU-E-T-329: Degrading Electron Beam Energy in Rotational Total Skin Electron Therapy

2011 ◽  
Vol 38 (6Part15) ◽  
pp. 3563-3563
Author(s):  
M Xu
1979 ◽  
Vol 40 (C7) ◽  
pp. C7-777-C7-778
Author(s):  
G. Fournier ◽  
J. Bonnet ◽  
J. Bridet ◽  
J. Fort ◽  
D. Pigache

2020 ◽  
Vol 62 (5) ◽  
pp. 055004 ◽  
Author(s):  
Guangyu Li ◽  
Quratul Ain ◽  
Song Li ◽  
Muhammad Saeed ◽  
Daniel Papp ◽  
...  

2001 ◽  
Vol 79 (2-3) ◽  
pp. 153-162 ◽  
Author(s):  
E Träbert ◽  
P Beiersdorfer ◽  
K B Fournier ◽  
S B Utter ◽  
K L Wong

Systematic variation of the electron-beam energy in an electron-beam ion trap has been employed to produce soft-X-ray spectra (20 to 60 Å) of Au with well-defined maximum charge states ranging from Br- to Co-like ions. Guided by large-scale relativistic atomic structure calculations, the strongest Δn = 0 (n = 4 to n' = 4) transitions in Rb- to Cu-like ions (Au42+ – Au50+) have been identified. PACS Nos.: 32.30Rj, 39.30+w, 31.50+w, 32.20R


Nature ◽  
2021 ◽  
Vol 599 (7886) ◽  
pp. 565-570
Author(s):  
M. Khachatryan ◽  
A. Papadopoulou ◽  
A. Ashkenazi ◽  
F. Hauenstein ◽  
A. Nambrath ◽  
...  

Vacuum ◽  
1988 ◽  
Vol 38 (11) ◽  
pp. 1041-1043 ◽  
Author(s):  
A Balasiński ◽  
A Jakubowski ◽  
A Świt

1982 ◽  
Vol 13 ◽  
Author(s):  
D. Barbierf ◽  
M. Baghdadi ◽  
A. Laugier ◽  
A. Cachard

ABSTRACTIn this work Pulsed Electron Beam Annealing has been used to Sctivaye As implanted in (100) and (111) silicon (140 keV- 1015 cm−2 ). With a selected electron beam energy deposition profile excellent regrowth layer quality and As activation has been obtained in the 1.2–1.4 J/cm2 fluence range. As redistribution is conistent with the melting model assuming a diffusivity of 10−4 cm2/s in liquid silicon. As losses might slightly reduce the carrier concentration near the surface in the case of (100) silicon. However a shallow and highly active N+ layer have been achieved with optimized PEBA conditions.


1985 ◽  
Vol 25 (4-6) ◽  
pp. 807-815
Author(s):  
E.A. Abramyan ◽  
B.A. Altercop ◽  
G.D. Kuleshov

2020 ◽  
Vol 226 ◽  
pp. 117379 ◽  
Author(s):  
Jean-Marc Costantini ◽  
Pooreun Seo ◽  
Kazuhiro Yasuda ◽  
AKM Saiful Islam Bhuian ◽  
Tatsuhiko Ogawa ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document