Treatment field shape verification using elliptic Fourier transform

1999 ◽  
Vol 26 (11) ◽  
pp. 2415-2421 ◽  
Author(s):  
Qinghuai Gao ◽  
Fang-Fang Yin ◽  
Kaiwen Nie
2017 ◽  
Vol 14 ◽  
pp. 92-101
Author(s):  
Anton Lyakh ◽  
Evgenija Dmitrieva ◽  
Maryana Popyuk ◽  
Olga Shikhat ◽  
Alexandr Melnik

The taxonomy of Ligophorus Euzet & Suriano, 1977, like the most of monopisthocotylean monogeneans, relies heavily on the morphology of sclerites of the posterior attachment organ (haptor). Geometric morphometric approach is used to analyse variability and compare the shapes of haptoral structures of these monogeneans. We outline the shapes of the sclerities by cubic Bezier curves and store results in SVG files. Every SVG outline is reduced to a set of harmonics of Elliptic Fourier transform using ElFourier program. Harmonics are the sequence of unique numbers that describe the shape of structures and are invariant to their sizes, rotation, and orientation. They allow reconstructing source outline images, finding their average form, analyzing variability and comparing shapes in combination with other numerical data like dimensions. We use that approach to investigate intra- and interspecific variability of 400 haptoral structures of seven representatives of Ligophorus, parasitising four mullet species from the Black Sea, and to discriminate these monogeneans. This method is perspective for the creation of semiautomatic key for identification of helminthes, which are mainly distinguished by the shape and dimensions of the attachment organs. The obtained results and method prospects are discussed.


Author(s):  
L. Reimer ◽  
R. Oelgeklaus

Quantitative electron energy-loss spectroscopy (EELS) needs a correction for the limited collection aperture α and a deconvolution of recorded spectra for eliminating the influence of multiple inelastic scattering. Reversely, it is of interest to calculate the influence of multiple scattering on EELS. The distribution f(w,θ,z) of scattered electrons as a function of energy loss w, scattering angle θ and reduced specimen thickness z=t/Λ (Λ=total mean-free-path) can either be recorded by angular-resolved EELS or calculated by a convolution of a normalized single-scattering function ϕ(w,θ). For rotational symmetry in angle (amorphous or polycrystalline specimens) this can be realised by the following sequence of operations :(1)where the two-dimensional distribution in angle is reduced to a one-dimensional function by a projection P, T is a two-dimensional Fourier transform in angle θ and energy loss w and the exponent -1 indicates a deprojection and inverse Fourier transform, respectively.


Author(s):  
John A. Reffner ◽  
William T. Wihlborg

The IRμs™ is the first fully integrated system for Fourier transform infrared (FT-IR) microscopy. FT-IR microscopy combines light microscopy for morphological examination with infrared spectroscopy for chemical identification of microscopic samples or domains. Because the IRμs system is a new tool for molecular microanalysis, its optical, mechanical and system design are described to illustrate the state of development of molecular microanalysis. Applications of infrared microspectroscopy are reviewed by Messerschmidt and Harthcock.Infrared spectral analysis of microscopic samples is not a new idea, it dates back to 1949, with the first commercial instrument being offered by Perkin-Elmer Co. Inc. in 1953. These early efforts showed promise but failed the test of practically. It was not until the advances in computer science were applied did infrared microspectroscopy emerge as a useful technique. Microscopes designed as accessories for Fourier transform infrared spectrometers have been commercially available since 1983. These accessory microscopes provide the best means for analytical spectroscopists to analyze microscopic samples, while not interfering with the FT-IR spectrometer’s normal functions.


Author(s):  
E. Voelkl ◽  
L. F. Allard

The conventional discrete Fourier transform can be extended to a discrete Extended Fourier transform (EFT). The EFT allows to work with discrete data in close analogy to the optical bench, where continuous data are processed. The EFT includes a capability to increase or decrease the resolution in Fourier space (thus the argument that CCD cameras with a higher number of pixels to increase the resolution in Fourier space is no longer valid). Fourier transforms may also be shifted with arbitrary increments, which is important in electron holography. Still, the analogy between the optical bench and discrete optics on a computer is limited by the Nyquist limit. In this abstract we discuss the capability with the EFT to change the initial sampling rate si of a recorded or simulated image to any other(final) sampling rate sf.


1996 ◽  
Vol 89 (4) ◽  
pp. 1145-1155
Author(s):  
JACQUES WALRAND ◽  
GHISLAIN BLANQUET ◽  
JEAN-FRANCOIS BLAVIER ◽  
HARALD BREDOHL ◽  
IWAN DUBOIS

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