Effect of Long Ultraviolet Radiation on the Human Eye

Science ◽  
1946 ◽  
Vol 104 (2698) ◽  
pp. 246-247 ◽  
Author(s):  
E. LUDVIGH ◽  
V. E. KINSEY
2001 ◽  
Vol 78 (SUPPLEMENT) ◽  
pp. 108
Author(s):  
Jan Bergmanson ◽  
Amber Gaume ◽  
Linda Moore ◽  
Hosam Sheriff ◽  
James Walsh

Author(s):  
Richard B. Kurzel ◽  
Myron L. Wolbarsht ◽  
Bill S. Yamanashi

Author(s):  
H.P. Rohr

Today, in image analysis the broadest possible rationalization and economization have become desirable. Basically, there are two approaches for image analysis: The image analysis through the so-called scanning methods which are usually performed without the human eye and the systems of optical semiautomatic analysis completely relying on the human eye.The new MOP AM 01 opto-manual system (fig.) represents one of the very promising approaches in this field. The instrument consists of an electronic counting and storing unit, which incorporates a microprocessor and a keyboard for choice of measuring parameters, well designed for easy use.Using the MOP AM 01 there are three possibilities of image analysis:the manual point counting,the opto-manual point counting andthe measurement of absolute areas and/or length (size distribution analysis included).To determine a point density for the calculation of the corresponding volume density the intercepts lying within the structure are scanned with the light pen.


Author(s):  
William J. Baxter

In this form of electron microscopy, photoelectrons emitted from a metal by ultraviolet radiation are accelerated and imaged onto a fluorescent screen by conventional electron optics. image contrast is determined by spatial variations in the intensity of the photoemission. The dominant source of contrast is due to changes in the photoelectric work function, between surfaces of different crystalline orientation, or different chemical composition. Topographical variations produce a relatively weak contrast due to shadowing and edge effects.Since the photoelectrons originate from the surface layers (e.g. ∼5-10 nm for metals), photoelectron microscopy is surface sensitive. Thus to see the microstructure of a metal the thin layer (∼3 nm) of surface oxide must be removed, either by ion bombardment or by thermal decomposition in the vacuum of the microscope.


2006 ◽  
Vol 175 (4S) ◽  
pp. 260-260
Author(s):  
Nicholas J. Rukin ◽  
Samuel J. Moon ◽  
Dhaval Bodiwala ◽  
Christopher J. Luscombe ◽  
Mark F. Saxby ◽  
...  

1913 ◽  
Vol 76 (1960supp) ◽  
pp. 51-51
Author(s):  
A. Gleichen

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