Current State of Forest Moss Communities after Reduction of Emissions from the Middle-Ural Copper Smelter

2021 ◽  
Vol 48 (10) ◽  
pp. 1924-1931
Author(s):  
M. R. Trubina ◽  
A. P. Dyachenko
Author(s):  
M. R. Trubina ◽  
A. Р. Dyachenko

The moss cover of forests in an 50×36 km area around the Middle-Ural Copper Smelter was analyzed after almost complete reduction of its emissions. It has been shown that the moss communities in the low and high pollution zones differ significantly in composition, number and frequency of species, but are characterized by a similar cover of ground mosses. The frequency of most species in the high pollution zones, compared to the low pollution zones, was decreased. A significant increase of the frequency in the pollution gradient was found for Pohlia nutans only. Species loss was expressed more strongly on the mesoscale (species richness within a community) than on the macroscale (the total number of species in a pollution zone). The elimination of species under increasing pollution was revealed for species with a low (up to 40%) initial frequency. Despite of the almost complete cessation of emissions from the smelter, the moss cover in the high pollution zones remains severely damaged and is formed by a single species (Pohlia nutans) over a significant area. However, localities with high species richness and high similarity of composition with the background communities occur even under high pollution conditions. The presence of such localities, in combination with a considerable time lag before the extinction of species from the study area as a whole, may have major significance for recolonization of degraded areas after emission reduction.


Author(s):  
G.D. Danilatos

Over recent years a new type of electron microscope - the environmental scanning electron microscope (ESEM) - has been developed for the examination of specimen surfaces in the presence of gases. A detailed series of reports on the system has appeared elsewhere. A review summary of the current state and potential of the system is presented here.The gas composition, temperature and pressure can be varied in the specimen chamber of the ESEM. With air, the pressure can be up to one atmosphere (about 1000 mbar). Environments with fully saturated water vapor only at room temperature (20-30 mbar) can be easily maintained whilst liquid water or other solutions, together with uncoated specimens, can be imaged routinely during various applications.


Author(s):  
C. Barry Carter

This paper will review the current state of understanding of interface structure and highlight some of the future needs and problems which must be overcome. The study of this subject can be separated into three different topics: 1) the fundamental electron microscopy aspects, 2) material-specific features of the study and 3) the characteristics of the particular interfaces. The two topics which are relevant to most studies are the choice of imaging techniques and sample preparation. The techniques used to study interfaces in the TEM include high-resolution imaging, conventional diffraction-contrast imaging, and phase-contrast imaging (Fresnel fringe images, diffuse scattering). The material studied affects not only the characteristics of the interfaces (through changes in bonding, etc.) but also the method used for sample preparation which may in turn have a significant affect on the resulting image. Finally, the actual nature and geometry of the interface must be considered. For example, it has become increasingly clear that the plane of the interface is particularly important whenever at least one of the adjoining grains is crystalline.A particularly productive approach to the study of interfaces is to combine different imaging techniques as illustrated in the study of grain boundaries in alumina. In this case, the conventional imaging approach showed that most grain boundaries in ion-thinned samples are grooved at the grain boundary although the extent of this grooving clearly depends on the crystallography of the surface. The use of diffuse scattering (from amorphous regions) gives invaluable information here since it can be used to confirm directly that surface grooving does occur and that the grooves can fill with amorphous material during sample preparation (see Fig. 1). Extensive use of image simulation has shown that, although information concerning the interface can be obtained from Fresnel-fringe images, the introduction of artifacts through sample preparation cannot be lightly ignored. The Fresnel-fringe simulation has been carried out using a commercial multislice program (TEMPAS) which was intended for simulation of high-resolution images.


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