Experimental study of temperature dependence of threshold characteristics in semiconductor VCSELs based on submonolayer InGaAs QDs
1996 ◽
Vol 225
(3-4)
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pp. 312-322
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2009 ◽
Vol 35
(7)
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pp. 614-617
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2008 ◽
Vol 2
(2)
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pp. 183-186
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2013 ◽
Vol 26
(4)
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pp. 830-838
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