2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual.
Latest Publications

TOTAL DOCUMENTS

121
(FIVE YEARS 0)

H-INDEX

19
(FIVE YEARS 0)

Published By IEEE

0780376498
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Growth and scaling of oxide conduction after breakdown

2003 ◽  
Author(s):  
B.P. Linder ◽  
J.H. Stathis ◽  
D.J. Frank ◽  
S. Lombardo ◽  
A. Vayshenker

Defect passivation and dark count in Geiger-mode avalanche photodiodes

2003 ◽  
Author(s):  
J.C. Jackson ◽  
G. Healy ◽  
A.-M. Kelleher ◽  
J. Alderman ◽  
J. Donnelly ◽  
...  
Keyword(s):  
Avalanche Photodiodes ◽  
Dark Count ◽  
Defect Passivation ◽  
Geiger Mode

Challenges of testing high-volume, low-cost 8-bit microcontrollers

2003 ◽  
Author(s):  
M. Stout ◽  
K. Tumin ◽  
C. Vargas ◽  
B. Gotchall
Keyword(s):  
Low Cost ◽  
High Volume

Consistency of optical data from PICA

2003 ◽  
Author(s):  
T. Lundquist ◽  
P. Le Coupanec ◽  
A. Abraham ◽  
W. Ng
Keyword(s):  
Optical Data

Stress polarity dependence of degradation and breakdown of SiO/sub 2//high-k stacks

2003 ◽  
Author(s):  
R. Degrave ◽  
T. Kauerauf ◽  
A. Kerber ◽  
E. Cartier ◽  
B. Govoreanu ◽  
...  
Keyword(s):  
High K
Load More ...
Sign in / Sign up

Export Citation Format

Share Document