Anodic Oxidation of Hydrogen-Transferred Silicon-on-Insulator Layers

Semiconductors ◽

10.1134/s1063782619020246 ◽

2019 ◽

Vol 53 (2) ◽

pp. 241-245

Author(s):

I. E. Tyschenko ◽

I. V. Popov ◽

E. V. Spesivtsev

Keyword(s):

Anodic Oxidation ◽

Silicon On Insulator ◽

Oxidation Of Hydrogen ◽

Insulator Layers

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Confined and Guided Vapor–Liquid–Solid Catalytic Growth of Silicon Nanoribbons: From Nanowires to Structured Silicon-on-Insulator Layers

Semiconductor-On-Insulator Materials for Nanoelectronics Applications - Engineering Materials ◽

10.1007/978-3-642-15868-1_4 ◽

2011 ◽

pp. 67-89

Author(s):

A. Lecestre ◽

E. Dubois ◽

A. Villaret ◽

T. Skotnicki ◽

P. Coronel ◽

...

Keyword(s):

Silicon On Insulator ◽

Vapor Liquid Solid ◽

Catalytic Growth ◽

Insulator Layers ◽

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Porous Silicon by Galvanostatic Electrochemical Anodisation of Epitaxial Silicon, Polycrystalline Silicon and Silicon on Insulator Layers

NATO Science for Peace and Security Series B: Physics and Biophysics - Advanced Sensors for Safety and Security ◽

10.1007/978-94-007-7003-4_28 ◽

2013 ◽

pp. 303-320 ◽

Author(s):

M. Ivanda ◽

M. Balarin ◽

O. Gamulin ◽

V. Đerek ◽

D. Ristić ◽

...

Keyword(s):

Porous Silicon ◽

Polycrystalline Silicon ◽

Silicon On Insulator ◽

Epitaxial Silicon ◽

Insulator Layers

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Formation and nondestructive characterization of ion implanted silicon‐on‐insulator layers

Applied Physics Letters ◽

10.1063/1.98435 ◽

1987 ◽

Vol 51 (5) ◽

pp. 343-345 ◽

Author(s):

J. Narayan ◽

S. Y. Kim ◽

K. Vedam ◽

R. Manukonda

Keyword(s):

Silicon On Insulator ◽

Insulator Layers ◽

Nondestructive Characterization ◽

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An electron paramagnetic resonance study of the anodic oxidation of hydrogen on platinum activated carbon electrodes

Journal of Electroanalytical Chemistry ◽

10.1016/s0022-0728(71)80185-7 ◽

1971 ◽

Vol 32 (2) ◽

pp. 183-198 ◽

Author(s):

Maurice Bonnemay ◽

Claude Lamy

Keyword(s):

Electron Paramagnetic Resonance ◽

Activated Carbon ◽

Anodic Oxidation ◽

Electron Paramagnetic Resonance Study ◽

Carbon Electrodes ◽

Paramagnetic Resonance ◽

Oxidation Of Hydrogen ◽

Electron Paramagnetic

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Analysis of structural defects in silicon-on-insulator layers with x-ray reflection topography

Journal of Crystal Growth ◽

10.1016/0022-0248(89)90560-5 ◽

1989 ◽

Vol 97 (3-4) ◽

pp. 599-606

Author(s):

M.J.J. Theunissen ◽

A.H. Goemans ◽

A.J.R. De Kock ◽

M.L.J. Geijselaers

Keyword(s):

Silicon On Insulator ◽

Structural Defects ◽

X Ray ◽

Insulator Layers

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Erratum to “Characterization of porous silicon-on-insulator films prepared by anodic oxidation” [Thin Solid Films, 276 (1996) 147–150]

Thin Solid Films ◽

10.1016/s0040-6090(96)09574-0 ◽

1997 ◽

Vol 293 (1-2) ◽

pp. 334

Author(s):

C.H. Lee ◽

C.C. Yeh ◽

H.L. Hwang ◽

Klaus Y.J. Hsu

Keyword(s):

Porous Silicon ◽

Anodic Oxidation ◽

Silicon On Insulator ◽

Thin Solid Films ◽

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In-depth profiling of electron trap states in silicon-on-insulator layers and local mechanical stress near the silicon-on-insulator/buried oxide interface in separation-by-implanted-oxygen wafers

Journal of Applied Physics ◽

10.1063/1.3520660 ◽

2010 ◽

Vol 108 (12) ◽

pp. 124505 ◽

Author(s):

Yoshikata Nakajima ◽

Takahiro Toda ◽

Tatsuro Hanajiri ◽

Toru Toyabe ◽

Takuo Sugano

Keyword(s):

Mechanical Stress ◽

Depth Profiling ◽

Electron Trap ◽

Silicon On Insulator ◽

Trap States ◽

Oxide Interface ◽

Buried Oxide ◽

Insulator Layers

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The Anodic Oxidation of Hydrogen on Platinized Tungsten Oxides: III . Mechanism of Oxidation on Platinized Lower Tungsten Oxide Electrodes

Journal of The Electrochemical Society ◽

10.1149/1.2134420 ◽

1975 ◽

Vol 122 (9) ◽

pp. 1174-1177 ◽

Author(s):

B. S. Hobbs ◽

A. C. C. Tseung

Keyword(s):

Tungsten Oxide ◽

Anodic Oxidation ◽

Tungsten Oxides ◽

Oxide Electrodes ◽

Oxidation Of Hydrogen ◽

Mechanism Of Oxidation

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Thermal conductivity model for thin silicon-on-insulator layers at high temperatures

IEEE International SOI Conference SOI-02 ◽

10.1109/soi.2002.1044411 ◽

2002 ◽

Author(s):

Asheghi ◽

Behkam ◽

Yazdani ◽

Joshi ◽

Goodson

Keyword(s):

Thermal Conductivity ◽

High Temperatures ◽

Silicon On Insulator ◽

Conductivity Model ◽

Thermal Conductivity Model ◽

Thin Silicon ◽

Insulator Layers

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Scanning electron microscopy study of seeded recrystallization of silicon‐on‐insulator layers with either polycrystalline or epitaxially deposited silicon in the seed windows

Journal of Applied Physics ◽

10.1063/1.339923 ◽

1988 ◽

Vol 63 (5) ◽

pp. 1438-1441 ◽

Author(s):

D. A. Smith ◽

R. A. McMahon ◽

H. Ahmed ◽

K. M. Barfoot ◽

T. B. Peters ◽

...

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Silicon On Insulator ◽

Scanning Electron Microscopy Study ◽

Insulator Layers ◽

Scanning Electron

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