Synthesis of epitaxial silicon carbide films through the substitution of atoms in the silicon crystal lattice: A review

2014 ◽  
Vol 56 (8) ◽  
pp. 1507-1535 ◽  
Author(s):  
S. A. Kukushkin ◽  
A. V. Osipov ◽  
N. A. Feoktistov
2016 ◽  
Vol 214 (4) ◽  
pp. 1600437 ◽  
Author(s):  
Atieh R. Kermany ◽  
James S. Bennett ◽  
Victor M. Valenzuela ◽  
Warwick P. Bowen ◽  
Francesca Iacopi

1996 ◽  
Vol 37 (1) ◽  
pp. 18-23
Author(s):  
V. M. Pinchuk ◽  
A. N. Nazarov ◽  
V. S. Lysenko ◽  
V. M. Kovalev

2012 ◽  
Vol 717-720 ◽  
pp. 275-278
Author(s):  
János Mizsei ◽  
Oleg Korolkov ◽  
Natalja Sleptsuk ◽  
Jana Toompuu ◽  
Toomas Rang

This paper is a summary of the experimental study of deep levels in a SiC crystal lattice caused by diffusion welding (DW). Investigations were carried out by DLTS and Kelvin Probe methods. Investigations revealed that DLTS method is not applicable for identification of surface states. Research conducted by the Kelvin Probe method has shown an increase in the density of surface states after the diffusion welding from 2x1015 cm-2 to 3.5x1016 cm-2.


2002 ◽  
Vol 236 (1-3) ◽  
pp. 101-112 ◽  
Author(s):  
U Forsberg ◽  
Ö Danielsson ◽  
A Henry ◽  
M.K Linnarsson ◽  
E Janzén

2010 ◽  
Vol 518 (6) ◽  
pp. S6-S11 ◽  
Author(s):  
Maurizio Masi ◽  
Alessandro Fiorucci ◽  
Massimo Camarda ◽  
Antonino La Magna ◽  
Francesco La Via

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