Image transmission with the subwavelength resolution in microwave, terahertz, and optical frequency bands

2007 ◽  
Vol 52 (9) ◽  
pp. 1009-1022 ◽  
Author(s):  
P. A. Belov ◽  
C. R. Simovski ◽  
P. Ikonen ◽  
M. G. Silveirinha ◽  
Y. Hao
Author(s):  
Vinod K. Berry ◽  
Xiao Zhang

In recent years it became apparent that we needed to improve productivity and efficiency in the Microscopy Laboratories in GE Plastics. It was realized that digital image acquisition, archiving, processing, analysis, and transmission over a network would be the best way to achieve this goal. Also, the capabilities of quantitative image analysis, image transmission etc. available with this approach would help us to increase our efficiency. Although the advantages of digital image acquisition, processing, archiving, etc. have been described and are being practiced in many SEM, laboratories, they have not been generally applied in microscopy laboratories (TEM, Optical, SEM and others) and impact on increased productivity has not been yet exploited as well.In order to attain our objective we have acquired a SEMICAPS imaging workstation for each of the GE Plastic sites in the United States. We have integrated the workstation with the microscopes and their peripherals as shown in Figure 1.


1992 ◽  
Vol 139 (5) ◽  
pp. 495 ◽  
Author(s):  
Q. Mongatti ◽  
L. Alparone ◽  
G. Benelli ◽  
S. Baronti ◽  
F. Lotti ◽  
...  

2016 ◽  
Vol 136 (7) ◽  
pp. 621-627
Author(s):  
Akiko Takahashi ◽  
Akihiro Yamagata ◽  
Jun Imai ◽  
Shigeyuki Funabiki

2015 ◽  
Vol E98.B (5) ◽  
pp. 773-782 ◽  
Author(s):  
Ngochao TRAN ◽  
Tetsuro IMAI ◽  
Yukihiko OKUMURA

1997 ◽  
Vol 51 (6-7) ◽  
pp. 25-27
Author(s):  
V. N. Frankov ◽  
G. Y. Osokin ◽  
O. V. Gavrentiuk ◽  
A. I. Samokhvalov

This paper discusses the use of Maximum Correlation kurtosis deconvolution (MCKD) method as a pre-processor in fast spectral kurtosis (FSK) method in order to find the compound fault characteristics of the bearing, by enhancing the vibration signals. FSK only extracts the resonance bands which have maximum kurtosis value, but sometimes it might possible that faults occur in the resonance bands which has low kurtosis value, also the faulty signals missed due to noise interference. In order to overcome these limitations FSK used with MCKD, MCKD extracts various faults present in different resonance frequency bands; also detect the weak impact component, as MCKD also dealt with strong background noise. By obtaining the MCKD parameters like, filter length & deconvolution period, we can extract the compound fault feature characteristics.


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