Peculiarities of spontaneous-grating formation in light-sensitive films under elliptically polarized laser radiation

1998 ◽  
Vol 76 (1) ◽  
pp. 77-85 ◽  
Author(s):  
V K Miloslavsky ◽  
L A Ageev ◽  
A Nahal
Keyword(s):  
Laser Radiation ◽  
Small Angle ◽  
Incident Light ◽  
Angular Position ◽  
Major Axis ◽  
Experimental Results ◽  
Angle Scattering ◽  
Diffraction Patterns ◽  
Elliptically Polarized ◽  
Grating Formation

The formation of spontaneous gratings in thin waveguide AgCl–Ag photosensitive films was studied under elliptically polarized laser radiation. New peculiarities of the gratings growth were found (i) a deviation in angular position of the wave vectors of the most probable microgratings from π / 2 about the major axis of the polarization ellipse; and (ii) an asymmetry, which depends on the ellipticity sign, in the diffraction and small-angle scattering patterns. The experimental results are explained within the framework of a model that shows the scattering of incident light by small prolate absorptive Ag spheroids oriented across the major axis of the ellipse and arising from the stage of photoinduced dichroism that precedes grating formation. We show that the dependence of the diffraction patterns' asymmetry on the ellipticity sign is related to an instability due to the angular position of the wave vectors of the most probable microgratings. PACS No. 78.65

SLADS: a parallel code for direct simulations of scattering of large anisotropic dense nanoparticle systems

2017 ◽  
Vol 50 (3) ◽  
pp. 951-958 ◽  
Author(s):  
Sen Chen ◽  
Juncheng E ◽  
Sheng-Nian Luo
Keyword(s):  
Analytical Solutions ◽  
Small Angle ◽  
Real Space ◽  
Small Angle Scattering ◽  
Two Dimensional ◽  
X Ray ◽  
X Ray Scattering ◽  
Angle Scattering ◽  
Parallel Code ◽  
Diffraction Patterns

SLADS(http://www.pims.ac.cn/Resources.html), a parallel code for direct simulations of X-ray scattering of large anisotropic dense nanoparticle systems of arbitrary species and atomic configurations, is presented. Particles can be of arbitrary shapes and dispersities, and interactions between particles are considered. Parallelization is achieved in real space for the sake of memory limitation. The system sizes attempted are up to one billion atoms, and particle concentrations in dense systems up to 0.36. Anisotropy is explored in terms of superlattices. One- and two-dimensional small-angle scattering or diffraction patterns are obtained.SLADSis validated self-consistently or against cases with analytical solutions.

An X-Ray Small-Angle Scattering Instrument

1967 ◽  
Vol 11 ◽  
pp. 332-338 ◽  
Author(s):  
Donald M. Koffman
Keyword(s):  
Small Angle ◽  
Scintillation Counter ◽  
Small Angle Scattering ◽  
High Angular Resolution ◽  
X Ray Diffraction ◽  
Multiple Diffraction ◽  
Double Crystal ◽  
X Ray ◽  
Angle Scattering ◽  
Diffraction Patterns

AbstractAn X-ray small-angle scattering instrument is described which is used for recording X-ray diffraction patterns or small-angle X-ray scattering curves in an angular region very close to the direct beam. The measurement of X-ray intensity is accomplished with standard geiger or scintillation counter techniques. The instrument is designed for use with a spot-focus or vertical-line X-ray source, In essence, it is a multiple-reflection double-crystal diffractometer, based on a concept developed by Bonse and Hart, employing two grooved perfect germanium crystals arranged in the parallel position. Multiple diffraction from these crystals produces a monochromated X-ray beam which can be several millimeters wide while still exhibiting extremely high angular resolution. As a result, effective sample volumes can be employed with maximum volume-to-thickness ratios. The principal features of the instrument are discussed with emphasis on the advantages of this device over those employing complex slit systems and film-re cording techniques, Data are presented to illustrate the operation, intensity, and resolution of the unit.

scholarly journals Hierarchical architecture of spider attachment setae reconstructed from scanning nanofocus X-ray diffraction data

2019 ◽  
Vol 16 (150) ◽  
pp. 20180692 ◽  
Author(s):  
Clemens F. Schaber ◽  
Silja Flenner ◽  
Anja Glisovic ◽  
Igor Krasnov ◽  
Martin Rosenthal ◽  
...  
Keyword(s):  
Small Angle ◽  
Adhesive Contact ◽  
Quantitative Information ◽  
Hair Shaft ◽  
Hierarchical Architecture ◽  
X Ray Diffraction ◽  
X Ray ◽  
Dry Adhesion ◽  
Angle Scattering ◽  
Diffraction Patterns

When sitting and walking, the feet of wandering spiders reversibly attach to many surfaces without the use of gluey secretions. Responsible for the spiders' dry adhesion are the hairy attachment pads that are built of specially shaped cuticular hairs (setae) equipped with approximately 1 µm wide and 20 nm thick plate-like contact elements (spatulae) facing the substrate. Using synchrotron-based scanning nanofocus X-ray diffraction methods, combining wide-angle X-ray diffraction/scattering and small-angle X-ray scattering, allowed substantial quantitative information to be gained about the structure and materials of these fibrous adhesive structures with 200 nm resolution. The fibre diffraction patterns showed the crystalline chitin chains oriented along the long axis of the attachment setae and increased intensity of the chitin signal dorsally within the seta shaft. The small-angle scattering signals clearly indicated an angular shift by approximately 80° of the microtrich structures that branch off the bulk hair shaft and end as the adhesive contact elements in the tip region of the seta. The results reveal the specific structural arrangement and distribution of the chitin fibres within the attachment hair's cuticle preventing material failure by tensile reinforcement and proper distribution of stresses that arise upon attachment and detachment.

Cross-Section Structure of Cylindrical and Polymer-like Micelles from Small-Angle Scattering Data. 2. Experimental Results

Langmuir ◽  
1996 ◽  
Vol 12 (10) ◽  
pp. 2433-2440 ◽  
Author(s):  
Peter Schurtenberger ◽  
Götz Jerke ◽  
Carolina Cavaco ◽  
Jan Skov Pedersen
Keyword(s):  
Cross Section ◽  
Small Angle ◽  
Small Angle Scattering ◽  
Experimental Results ◽  
Scattering Data ◽  
Angle Scattering ◽  
Section Structure

Surface Electronic Function Properties Characterization from Defect Heterogeneity Dominated Specular/Glancing/Grazing Versus Bulk Transmission Small-Angle-Scattering(SAS) Diffraction-Pattern via the Static Synergetics Algorithm/Exprimental Model

1985 ◽  
Vol 48 ◽  
Author(s):  
Edward Siegel
Keyword(s):  
Diffraction Pattern ◽  
Small Angle ◽  
Grazing Incidence ◽  
Small Angle Scattering ◽  
Static Structure Factor ◽  
Complex Frequency ◽  
Static Structure ◽  
Mathematical Algorithm ◽  
Angle Scattering ◽  
Diffraction Patterns

ABSTRACTThe ability of Static Synergetios,the universal,reversible,scalable mathematical algorithm/(used as an) experimental model, connecting external radiation small-angle-scattering diffraction-pattern/static structure factor SSAS (k),dominated by defect heterogeneities/clumps/clusters,to electronic (magniic,mechanical) complex,frequency-dependent electrical,dielectric, noise,optical…Function properties,can be enhanced by utilizing a comparison/difference of bulk transmission versus surface specular/glancing/grazing incidence small-angle-scattering diffraction-patterns.

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