Ultra-low-energy electron scattering cross section measurements of Ar, Kr and Xe employing the threshold photoelectron source
Keyword(s):
2004 ◽
Vol 121
(9)
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pp. 4284-4291
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2000 ◽
Vol 113
(9)
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pp. 3602-3608
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1978 ◽
Vol 91
(3-4)
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pp. 575-583
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1997 ◽
Vol 107
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pp. 3478-3484
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1966 ◽
Vol 21
(3)
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pp. 360-361
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1992 ◽
Vol 25
(2)
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pp. 533-543
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1991 ◽
Vol 9
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pp. 3578
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1998 ◽
Vol 31
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pp. 4663-4687
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