X-RAY DIFFRACTION IN SITU STUDY OF PHASE FORMATION AND AMORPHOUS-TO-NANOCRYSTALLINE TRANSFORMATION IN FeCuNbSiB ALLOYS

APPC 2000 ◽  
2001 ◽  
Author(s):  
LE THI CAT TUONG ◽  
PHAN VINH PHUC ◽  
NGUYEN HOANG NGHI
2011 ◽  
Vol 172-174 ◽  
pp. 646-651 ◽  
Author(s):  
Gamra Tellouche ◽  
Khalid Hoummada ◽  
Dominique Mangelinck ◽  
Ivan Blum

The phase formation sequence of Ni silicide for different thicknesses is studied by in situ X ray diffraction and differential scanning calorimetry measurements. The formation of a transient phase is observed during the formation of δ-Ni2Si; transient phases grow and disappear during the growth of another phase. A possible mechanism is proposed for the transient phase formation and consumption. It is applied to the growth and consumption of θ-Ni2Si. A good accordance is found between the proposed model and in situ measurement of the kinetics of phase formation obtained by x-ray diffraction and differential scanning calorimetry for higher thickness.


2000 ◽  
Vol 71 (11) ◽  
pp. 4177 ◽  
Author(s):  
Margret J. Geselbracht ◽  
Richard I. Walton ◽  
E. Sarah Cowell ◽  
Franck Millange ◽  
Dermot O’Hare

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