FLUCTUATIONS AND ULTRAFAST PROCESSES IN VOLTAGE-BIASED TWO-DIMENSIONAL CHANNELS
2008 ◽
Vol 18
(04)
◽
pp. 923-933
◽
Keyword(s):
Hot-electron fluctuation techniques were developed for experimental investigation of picosecond and subpicosecond electronic and phononic processes in voltage-biased 2DEG channels of interest for microwave low-noise and high-power transistors. Examples illustrate real-space transfer, hot-electron energy relaxation, and occupancy relaxation of hot-phonon modes. The pioneering results on hot-electron energy relaxation and hot-phonon lifetime are confirmed by time-resolved response experiments. The fluctuation technique for measuring the hot-phonon lifetime as a function of the hot-phonon temperature is unique, no datum has been reported for comparison as yet.
2007 ◽
Vol 47
(4)
◽
pp. 491-498
◽
Keyword(s):
1992 ◽
Vol 7
(3B)
◽
pp. B60-B66
◽
1989 ◽
Vol 32
(12)
◽
pp. 1207-1212
◽
Keyword(s):
1989 ◽
Vol 4
(10)
◽
pp. 852-857
◽
2012 ◽
Vol 44
(7-8)
◽
pp. 1766-1769
◽
Keyword(s):
2008 ◽
Vol 23
(7)
◽
pp. 075048
◽
Keyword(s):
2001 ◽
Vol 17
(1)
◽
pp. 18-29
◽
Keyword(s):
2007 ◽
pp. 321-328
◽
Keyword(s):