MEASUREMENT OF CRITICAL EXPONENTS OF PLATINUM THIN FILMS
2003 ◽
Vol 10
(01)
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pp. 1-5
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Keyword(s):
We have fabricated platinum thin films by metal plasma ion deposition on silicon substrates. The roughness of these films has been measured by a scanning tunneling microscope (STM) and we have determined the growth dynamics critical exponents.
2003 ◽
Vol 10
(06)
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pp. 903-908
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Keyword(s):
2013 ◽
Vol 84
(12)
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pp. 123905
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1995 ◽
Vol 255
(1-2)
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pp. 30-36
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2011 ◽
Vol 82
(5)
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pp. 053703
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Keyword(s):
Keyword(s):