scholarly journals Surface structures and energy gap of YBa2Cu3Oy/PrBa2Cu3Oy superlattices and YBa2Cu3Oy thin films probed with a scanning tunneling microscope and a scanning force microscope

1995 ◽  
Vol 255 (1-2) ◽  
pp. 30-36 ◽  
Author(s):  
Y. Chen ◽  
L.M. Wang ◽  
H.C. Yang ◽  
H.E. Horng ◽  
H.H. Sung
Keyword(s):  
Thin Films ◽  
Scanning Tunneling Microscope ◽  
Energy Gap ◽  
Surface Structures ◽  
Scanning Tunneling ◽  
Scanning Force Microscope ◽  
Tunneling Microscope ◽  
Scanning Force

scholarly journals A 350 mK, 9 T scanning tunneling microscope for the study of superconducting thin films on insulating substrates and single crystals

2013 ◽  
Vol 84 (12) ◽  
pp. 123905 ◽  
Author(s):  
Anand Kamlapure ◽  
Garima Saraswat ◽  
Somesh Chandra Ganguli ◽  
Vivas Bagwe ◽  
Pratap Raychaudhuri ◽  
...  
Keyword(s):  
Thin Films ◽  
Single Crystals ◽  
Scanning Tunneling Microscope ◽  
Scanning Tunneling ◽  
Superconducting Thin Films ◽  
Tunneling Microscope ◽  
Insulating Substrates

Surface Modification and Measurement Using a Scanning Tunneling Microscope With a Diamond Tip

1992 ◽  
Vol 114 (3) ◽  
pp. 493-498 ◽  
Author(s):  
D. B. Bogy
Keyword(s):  
Thin Films ◽  
Scanning Tunneling Microscope ◽  
Scanning Tunneling ◽  
Magnetic Media ◽  
Tunneling Microscopy ◽  
Tunneling Microscope ◽  
Hardness Tester ◽  
Excellent Control ◽  
Subsequent Measurement ◽  
Normal Head

Scanning Tunneling Microscopy is used to modify and measure the surface of magnetic media disks. A very rugged diamond tip allows continued scanning after it has severely scratched or punched the surface. Three techniques are used. First a manual method of penetrating the surface using a stand-alone head makes a scratch of essentially uncontrollable length and depth. Then the normal head is used to cause surface penetration by removing the bias voltage while scanning. Better control is obtained as regards the location and depth of the indentation. Excellent control of indentation location and depth can be obtained by using a new software developed by the STM manufacturer to push the tip into the surface with the piezoelectric scanner. The control of the indentations and their subsequent measurement may make the STM a useful tool as a hardness tester for ultra-thin films, on the order of a few tens of nanometers.

MEASUREMENT OF CRITICAL EXPONENTS OF PLATINUM THIN FILMS

2003 ◽  
Vol 10 (01) ◽  
pp. 1-5 ◽  
Author(s):  
M. C. SALVADORI ◽  
L. L. MELO ◽  
M. CATTANI ◽  
O. R. MONTEIRO ◽  
I. G. BROWN
Keyword(s):  
Thin Films ◽  
Critical Exponents ◽  
Scanning Tunneling Microscope ◽  
Growth Dynamics ◽  
Scanning Tunneling ◽  
Silicon Substrates ◽  
Tunneling Microscope ◽  
Metal Plasma ◽  
Ion Deposition

We have fabricated platinum thin films by metal plasma ion deposition on silicon substrates. The roughness of these films has been measured by a scanning tunneling microscope (STM) and we have determined the growth dynamics critical exponents.

scholarly journals Nanoscale phase change on Ge2Sb2Te5 thin films induced by optical near fields with photoassisted scanning tunneling microscope

2020 ◽  
Vol 117 (21) ◽  
pp. 211102
Author(s):  
Kanta Asakawa ◽  
Dang-il Kim ◽  
Shotaro Yaguchi ◽  
Mikito Tsujii ◽  
Katsumasa Yoshioka ◽  
...  
Keyword(s):  
Thin Films ◽  
Phase Change ◽  
Scanning Tunneling Microscope ◽  
Scanning Tunneling ◽  
Tunneling Microscope
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