Relationship between Electrical Conductivity and Charged- Dangling-Bond Density in Nitrogen- and Phosphorus-Doped Hydrogenated Amorphous Silicon

1994 ◽  
Vol 33 (Part 2, No. 9B) ◽  
pp. L1295-L1297 ◽  
Author(s):  
Atsushi Masuda ◽  
Ken-ichi Itoh ◽  
Jiang-Huai Zhou ◽  
Minoru Kumeda ◽  
Tatsuo Shimizu
Keyword(s):  
Electrical Conductivity ◽  
Amorphous Silicon ◽  
Hydrogenated Amorphous Silicon ◽  
Dangling Bond ◽  
Nitrogen And Phosphorus ◽  
Bond Density ◽  
Phosphorus Doped ◽  
Hydrogenated Amorphous

Capacitance Studies of Light-Induced Effects in Undoped Hydrogenated Amorphous Silicon

1985 ◽  
Vol 49 ◽  
Author(s):  
K. Zellama ◽  
J.D. Cohen ◽  
J.P. Harbison
Keyword(s):  
Electrical Conductivity ◽  
Amorphous Silicon ◽  
Density Of States ◽  
Hydrogenated Amorphous Silicon ◽  
Dangling Bond ◽  
Light Saturation ◽  
Band Tail ◽  
Bond Density ◽  
Induced Changes ◽  
Hydrogenated Amorphous

AbstractThe effects of light saturation on the properties of undoped a-Si:H films were studied by a new capacitance profiling technique which can be used to directly determine changes in the dangling bond density of states near midgap. Coplanar conductivity and capacitance vs. temperature measurements save the changes in activation energies for electrical conductivity. These studies indicate that, while substantial increases in the dangling bond densities are observed for most samples, the detailed behavior of the light induced changes in these films are inconsistent with the creation of such defects by breaking weak valence band tail states.

scholarly journals Material Parameters in a Thick Hydrogenated Amorphous Silicon Detector and their Effect on Signal Collection

1989 ◽  
Vol 149 ◽  
Author(s):  
S. Qureshi ◽  
V. Perez-Mendez ◽  
S. N. Kaplan ◽  
I. Fujieda ◽  
G. Cho
Keyword(s):  
Amorphous Silicon ◽  
Defect Density ◽  
Hydrogenated Amorphous Silicon ◽  
Silicon Detector ◽  
Dangling Bond ◽  
Material Parameters ◽  
Bond Density ◽  
Transient Photoconductivity ◽  
Signal Collection ◽  
Hydrogenated Amorphous

ABSTRACTTransient photoconductivity and ESR measurements were done to relate the ionized dangling bond density and the spin density of thick hydrogenated amorphous silicon (a-Si:H) detectors. We found that only a fraction (∼30–35%) of the total defect density as measured by ESR is ionized when the detector is biased into deep depletion. The measurements on annealed samples also show that this fraction is about 0.3. An explanation based on the shift of the Fermi energy is given. The measurements show that the time dependence of relaxation is a stretched exponential.

scholarly journals Defect Frozen Phenomena in Phosphorus-Doped Hydrogenated Amorphous Silicon

1989 ◽  
Vol 97 (1127) ◽  
pp. 699-705
Author(s):  
Yukio OSAKA ◽  
Hiroyuki NASU ◽  
Chikashi AKAMATSU ◽  
Ryo HAYASHI
Keyword(s):  
Amorphous Silicon ◽  
Hydrogenated Amorphous Silicon ◽  
Phosphorus Doped ◽  
Hydrogenated Amorphous

Doping Mechanism in Tetrahedral Amorphous Carbon

1997 ◽  
Vol 498 ◽  
Author(s):  
C W Chen ◽  
J Robertson
Keyword(s):  
Amorphous Silicon ◽  
Amorphous Carbon ◽  
Hydrogenated Amorphous Silicon ◽  
Donor Atom ◽  
Dangling Bond ◽  
Coulombic Repulsion ◽  
Tetrahedral Amorphous Carbon ◽  
Total Energies ◽  
Doping Mechanism ◽  
Hydrogenated Amorphous

ABSTRACTDoping in hydrogenated amorphous silicon occurs by a process of an ionised donor atom partially compensated by a charged dangling bond. The total energies of various dopant and dopant/bonding combinations are calculated for tetrahedral amorphous carbon. It is found that charged dangling bonds are less favoured because of the stronger Coulombic repulsion in ta-C. Instead the dopants can be compensated by weak bond states in the lower gap associated with odd-membered π-rings or odd-numbered π-chains. The effect is that the doping efficiency is low but there are not charged midgap recombination centres, to reduce photoconductivity or photoluminescence with doping, as occurs in a-Si:H.

Observation of slow dangling-bond relaxation inp-type hydrogenated amorphous silicon

1995 ◽  
Vol 51 (4) ◽  
pp. 2173-2179 ◽  
Author(s):  
Martin W. Carlen ◽  
Yueqin Xu ◽  
Richard S. Crandall
Keyword(s):  
Amorphous Silicon ◽  
Hydrogenated Amorphous Silicon ◽  
Dangling Bond ◽  
Hydrogenated Amorphous
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