Structures and Electrical Properties of Fullerene Thin Films on Si(111)-7×7 Surface Investigated by Noncontact Atomic Force Microscopy

2000 ◽  
Vol 39 (Part 1, No. 6B) ◽  
pp. 3827-3829 ◽  
Author(s):  
Kei Kobayashi ◽  
Hirofumi Yamada ◽  
Toshihisa Horiuchi ◽  
Kazumi Matsushige
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Electrical Properties ◽  
Force Microscopy ◽  
Atomic Force

Observation of the effects of Bi-deficiency on ferroelectric and electrical properties in Bi(1+x)FeO3/La0.65Sr0.35MnO3 heterostructures via atomic force microscopy

RSC Advances ◽  
2016 ◽  
Vol 6 (116) ◽  
pp. 115039-115045 ◽  
Author(s):  
Qing Liu ◽  
Jieling Zhang ◽  
Ling Wei ◽  
Weifeng Zhang
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Electrical Properties ◽  
Pulsed Laser Deposition ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
Force Microscopy ◽  
Atomic Force

Bi(1+x)FeO3 thin films with different Bi contents (x = 0%, 5%, and 10%) were grown on (001) SrTiO3 substrates with La0.65Sr0.35MnO3 (LSMO) buffered layers via pulsed laser deposition.

Investigations of Local Electrical Properties of Pentacene Thin Films by Dual-Probe Atomic Force Microscopy

2010 ◽  
Vol 49 (8) ◽  
pp. 08LB10 ◽  
Author(s):  
Masaharu Hirose ◽  
Eika Tsunemi ◽  
Kei Kobayashi ◽  
Hirofumi Yamada ◽  
Kazumi Matsushige
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Electrical Properties ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dual Probe

Atomic force microscopy with a conducting tip: correlation studies between microstructure and electrical properties of YBaCuO thin films

2000 ◽  
Vol 341-348 ◽  
pp. 1965-1968 ◽  
Author(s):  
A.F. Dégardin ◽  
O. Schneegans ◽  
F. Houzé ◽  
É. Caristan ◽  
A. De Luca ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Electrical Properties ◽  
Force Microscopy ◽  
Correlation Studies ◽  
Atomic Force

Highly soluble tetrasubstituted lanthanide bis-phthalocyanines; synthesis, characterization, electrical properties and aggregation studies

2016 ◽  
Vol 20 (08n11) ◽  
pp. 1065-1074 ◽  
Author(s):  
Ahmet T. Bilgiçli ◽  
Armağan Günsel ◽  
Mehmet Kandaz ◽  
Ahmet Altındal ◽  
Hüseyin Cömert
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Electrical Properties ◽  
Electrical Transport ◽  
Hole Mobility ◽  
Electrical Transport Properties ◽  
Force Microscopy ◽  
Atomic Force ◽  
Vis Spectroscopy ◽  
Coating Method

We report the synthesis, characterization and electrical properties of lanthanide metal based bis-phthalocyanines, {M[Pc-(β-HHT)4]2} (HHT:1-hydroxyhexane-3-ylthio){ M [Formula: see text] Lu[Formula: see text] (2), Eu[Formula: see text] (3), and Yb[Formula: see text] (4)}. The interaction of bis-phthalocyanines with Ag[Formula: see text] and Pd[Formula: see text] metal ions were investigated by UV-vis spectroscopy and atomic force microscopy. Thin films of bis-phthalocyanine molecules were prepared by spin-coating method. The surface morphology of thin films were performed with Atomic Force Microscopy as further investigate. The electrical transport properties of ITO/Pc/Al devices were investigated. At low voltages all the films showed an ohmic conduction, whereas at higher voltage levels the conduction is dominated by space charged limited conduction with exponential distribution of trapping levels. Measurements of current density as a function of inverse temperature at constant applied voltage yielded a hole mobility values, μp[Formula: see text], [Formula: see text] and [Formula: see text] m2.sn[Formula: see text].V[Formula: see text] for lanthanium phthalocyanines. From the analysis of frequency, ω, dependence of electrical conductivity, σac. it was found that the [Formula: see text] obeys the power law given by σac = Aωs, in which the frequency exponent “s” decreases with temperature.

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