Topography and Local Electrical Properties of Nondoped Polycrystalline Silicon Thin Films Evaluated Using Conductive-Mode Atomic Force Microscopy
2003 ◽
Vol 42
(Part 2, No. 11A)
◽
pp. L1302-L1304
2003 ◽
Vol 93
◽
pp. 339-344
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2001 ◽
Vol 397
(1-2)
◽
pp. 133-137
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Keyword(s):
2012 ◽
Vol 358
(17)
◽
pp. 2082-2085
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2011 ◽
Vol 5
(10-11)
◽
pp. 373-375
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2000 ◽
Vol 39
(Part 1, No. 6B)
◽
pp. 3827-3829
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Keyword(s):