scholarly journals Influence of Oxygen Pressure on the Domain Dynamics and Local Electrical Properties of BiFe0.95Mn0.05O3 Thin Films Studied by Piezoresponse Force Microscopy and Conductive Atomic Force Microscopy

Materials ◽  
2017 ◽  
Vol 10 (11) ◽  
pp. 1258 ◽  
Author(s):  
Kunyu Zhao ◽  
Huizhu Yu ◽  
Jian Zou ◽  
Huarong Zeng ◽  
Guorong Li ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Electrical Properties ◽  
Oxygen Pressure ◽  
Piezoresponse Force Microscopy ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Domain Dynamics

Using Conductive Atomic Force Microscopy to the Evaluate Electrical Properties of MoS2 nanoparticles for Device Applications

2021 ◽  
Vol 104 (3) ◽  
pp. 17-19
Author(s):  
Aisha Alhammadi ◽  
Wafa Alnaqbi ◽  
Juveiriah Ashraf ◽  
Ayman Rezk ◽  
Ammar Nayfeh
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Properties ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Device Applications ◽  
Mos2 Nanoparticles

Role of the tip induced local anodic oxidation in the conductive atomic force microscopy of mixed phase silicon thin films

2010 ◽  
pp. NA-NA ◽  
Author(s):  
Aliaksei Vetushka ◽  
Antonin Fejfar ◽  
Martin Ledinský ◽  
Bohuslav Rezek ◽  
Jiří Stuchlík ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Anodic Oxidation ◽  
Mixed Phase ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Silicon Thin Films ◽  
Atomic Force ◽  
Local Anodic Oxidation
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