Spectroscopic Ellipsometry Studies on Ultrathin Hydrogenated Amorphous Silicon Films Prepared by Thermal Chemical Vapor Deposition

2000 ◽  
Vol 39 (Part 1, No. 11) ◽  
pp. 6196-6201 ◽  
Author(s):  
Sukti Hazra ◽  
Mitsuyuki Yamanaka ◽  
Isao Sakata ◽  
Toshiyuki Tsutsumi ◽  
Tatsuro Maeda ◽  
...  
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