Degradation of Low-Frequency Noise in Partially Depleted Silicon-on-Insulator Metal Oxide Semiconductor Field-Effect Transistors by Hot-Carrier Stress
2005 ◽
Vol 44
(6A)
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pp. 3832-3835
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2011 ◽
Vol 50
(10S)
◽
pp. 10PB01
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2011 ◽
Vol 50
(10)
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pp. 10PB01
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2000 ◽
Vol 40
(11)
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pp. 1897-1903
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2010 ◽
Vol 49
(8)
◽
pp. 084201
◽
2001 ◽
Vol 40
(Part 1, No. 9A)
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pp. 5290-5293
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2011 ◽
Vol 50
(4)
◽
pp. 04DC01
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2011 ◽
Vol 50
(10S)
◽
pp. 10PB02
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