Dependence of Hot Carrier Reliability and Low Frequency Noise on Channel Stress in Nanoscale n-Channel Metal–Oxide–Semiconductor Field-Effect Transistors

2011 ◽  
Vol 50 (10S) ◽  
pp. 10PB01 ◽  
Author(s):  
Hyuk-Min Kwon ◽  
Jung-Deuk Bok ◽  
In-Shik Han ◽  
Sang-Uk Park ◽  
Yi-Jung Jung ◽  
...  
Keyword(s):  
Metal Oxide ◽  
Field Effect ◽  
Field Effect Transistors ◽  
Low Frequency ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Hot Carrier

Low frequency noise in 4H-SiC metal oxide semiconductor field effect transistors

2008 ◽  
Vol 104 (9) ◽  
pp. 094505 ◽  
Author(s):  
S. L. Rumyantsev ◽  
M. S. Shur ◽  
M. E. Levinshtein ◽  
P. A. Ivanov ◽  
J. W. Palmour ◽  
...  
Keyword(s):  
Metal Oxide ◽  
Field Effect ◽  
Field Effect Transistors ◽  
Low Frequency ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Frequency Noise ◽  
Low Frequency Noise

Analysis of the Low-Frequency Noise Reduction in Si(100) Metal–Oxide–Semiconductor Field-Effect Transistors

2011 ◽  
Vol 50 (4) ◽  
pp. 04DC01 ◽  
Author(s):  
Philippe Gaubert ◽  
Akinobu Teramoto ◽  
Rihito Kuroda ◽  
Yukihisa Nakao ◽  
Hiroaki Tanaka ◽  
...  
Keyword(s):  
Metal Oxide ◽  
Noise Reduction ◽  
Field Effect ◽  
Field Effect Transistors ◽  
Low Frequency ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Frequency Noise ◽  
Low Frequency Noise
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