Junction Temperature in Ultraviolet Light-Emitting Diodes

2005 ◽  
Vol 44 (10) ◽  
pp. 7260-7266 ◽  
Author(s):  
Yangang Xi ◽  
Thomas Gessmann ◽  
Jingqun Xi ◽  
Jong Kyu Kim ◽  
Jay M. Shah ◽  
...  
2021 ◽  
Author(s):  
C. Yuqin Zong ◽  
Cameron Miller

We have developed a new calibration capability for 200 nm to 400 nm ultraviolet light-emitting diodes (UV LEDs) using a Type D gonio-spectroradiometer. The recently-introduced mean differential continuous pulse (M-DCP) method is used to overcome the measurement difficulty associated with the initial forward voltage, VF, anomaly of a UV LED, which makes it impossible to use VF to infer junction temperature, TJ, during pulsed operation. The new measurement facility was validated indirectly by comparing the measured total luminous flux of a white LED with that measured using the NIST’s 2.5 m absolute integrating sphere. The expanded calibration uncertainty for the total radiant flux is approximately 2 % to 3 % (k = 2) depending the wavelength of the UV LED.


2017 ◽  
Vol 9 (5) ◽  
pp. 05031-1-05031-5 ◽  
Author(s):  
V. P. Veleschuk ◽  
◽  
A. I. Vlasenko ◽  
Z. K. Vlasenko ◽  
D. N. Khmil ◽  
...  

Author(s):  
Andreas Liudi Mulyo ◽  
Anjan Mukherjee ◽  
Ida Marie Høiaas ◽  
Lyubomir Ahtapodov ◽  
Tron Arne Nilsen ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document