Characterization of Low-Frequency Noise in Etched GaAs Nanowire Field-Effect Transistors Having SiN$_{x}$ Gate Insulator

2012 ◽  
Vol 51 ◽  
pp. 06FE18 ◽  
Author(s):  
Toru Muramatsu ◽  
Kensuke Miura ◽  
Yuta Shiratori ◽  
Zenji Yatabe ◽  
Seiya Kasai
Keyword(s):  
Field Effect ◽  
Field Effect Transistors ◽  
Low Frequency ◽  
Gate Insulator ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Gaas Nanowire

Characterization of Low-Frequency Noise in Etched GaAs Nanowire Field-Effect Transistors Having SiNxGate Insulator

2012 ◽  
Vol 51 (6S) ◽  
pp. 06FE18 ◽  
Author(s):  
Toru Muramatsu ◽  
Kensuke Miura ◽  
Yuta Shiratori ◽  
Zenji Yatabe ◽  
Seiya Kasai
Keyword(s):  
Field Effect ◽  
Field Effect Transistors ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Gaas Nanowire

Characterization of Channel-Diameter-Dependent Low-Frequency Noise in Silicon Nanowire Field-Effect Transistors

2012 ◽  
Vol 33 (10) ◽  
pp. 1348-1350 ◽  
Author(s):  
Sang-Hyun Lee ◽  
Chang-Ki Baek ◽  
Sooyoung Park ◽  
Dong-Won Kim ◽  
Dong Kyun Sohn ◽  
...  
Keyword(s):  
Field Effect ◽  
Field Effect Transistors ◽  
Silicon Nanowire ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Channel Diameter

Low-frequency noise in top-gated ambipolar carbon nanotube field effect transistors

2008 ◽  
Vol 92 (22) ◽  
pp. 223114 ◽  
Author(s):  
Guangyu Xu ◽  
Fei Liu ◽  
Song Han ◽  
Koungmin Ryu ◽  
Alexander Badmaev ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Field Effect ◽  
Field Effect Transistors ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise

Low frequency noise in 4H-SiC metal oxide semiconductor field effect transistors

2008 ◽  
Vol 104 (9) ◽  
pp. 094505 ◽  
Author(s):  
S. L. Rumyantsev ◽  
M. S. Shur ◽  
M. E. Levinshtein ◽  
P. A. Ivanov ◽  
J. W. Palmour ◽  
...  
Keyword(s):  
Metal Oxide ◽  
Field Effect ◽  
Field Effect Transistors ◽  
Low Frequency ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Frequency Noise ◽  
Low Frequency Noise

Transitions between channel and contact regimes of low-frequency noise in many-layer MoS2 field effect transistors

2019 ◽  
Vol 114 (11) ◽  
pp. 113502 ◽  
Author(s):  
Jiseok Kwon ◽  
Joon Hyeong Park ◽  
Collin J. Delker ◽  
Charles T. Harris ◽  
Brian Swartzentruber ◽  
...  
Keyword(s):  
Field Effect ◽  
Field Effect Transistors ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise
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