Energy profiling for mPlatform

Author(s):  
Yaohua Sun ◽  
Ting Zhu ◽  
Ziguo Zhong ◽  
Tian He
Keyword(s):  
2019 ◽  
Vol 102 (12) ◽  
pp. 11169-11179 ◽  
Author(s):  
S.L. Smith ◽  
S.J. Denholm ◽  
M.P. Coffey ◽  
E. Wall

Author(s):  
Andrea Dardanelli ◽  
Mara Tanelli ◽  
Bruno Picasso ◽  
Sergio M. Savaresi ◽  
Onorino di Tanna ◽  
...  

2013 ◽  
Vol 102 (3) ◽  
pp. 994-1007 ◽  
Author(s):  
Jan Kendall De Kruif ◽  
Jiyi Khoo ◽  
Roberto Bravo ◽  
Martin Kuentz

2017 ◽  
Vol 62 (3) ◽  
pp. 499-501 ◽  
Author(s):  
S. S. Arzumanov ◽  
V. I. Morozov ◽  
Yu. N. Panin ◽  
A. N. Strepetov

2000 ◽  
Vol 654 ◽  
Author(s):  
Chang-Xin Guo ◽  
Donald E. Ellis ◽  
Vinayak P. Dravid ◽  
Luke Brewer

AbstractThe atomic arrangement and electronic structure in the vicinity of Ni(111)- ZrO2(100)(Cubic) and NiO(111)-Ni(111)-ZrO2(100)(Cubic) interfaces have been studied by atomistic simulation and by first-principles Density Functional theory. “Depth Profiling” is carred out in both methodologies, to determine modifications of cohesive energy and electron distribution of atomic layers from the interface plane. The energy profiling results show the interface consists of only a few atomic layers. Simulation results and electron density analyses are in good agreement with High Resolution Spatially Resolved Electron Microscopy data.


2015 ◽  
Vol 58 ◽  
pp. 42-59 ◽  
Author(s):  
Raja Wasim Ahmad ◽  
Abdullah Gani ◽  
Siti Hafizah Ab. Hamid ◽  
Feng Xia ◽  
Muhammad Shiraz

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