scholarly journals DeepIaC: deep learning-based linguistic anti-pattern detection in IaC

Author(s):  
Nemania Borovits ◽  
Indika Kumara ◽  
Parvathy Krishnan ◽  
Stefano Dalla Palma ◽  
Dario Di Nucci ◽  
...  
2020 ◽  
Vol 46 (3) ◽  
pp. 326-337
Author(s):  
Seung Ho Baek ◽  
Chang Hyun Lee ◽  
Seoung Bum Kim

Electronics ◽  
2020 ◽  
Vol 9 (7) ◽  
pp. 1140
Author(s):  
Jeong-Hee Lee ◽  
Jongseok Kang ◽  
We Shim ◽  
Hyun-Sang Chung ◽  
Tae-Eung Sung

Building a pattern detection model using a deep learning algorithm for data collected from manufacturing sites is an effective way for to perform decision-making and assess business feasibility for enterprises, by providing the results and implications of the patterns analysis of big data occurring at manufacturing sites. To identify the threshold of the abnormal pattern requires collaboration between data analysts and manufacturing process experts, but it is practically difficult and time-consuming. This paper suggests how to derive the threshold setting of the abnormal pattern without manual labelling by process experts, and offers a prediction algorithm to predict the potentials of future failures in advance by using the hybrid Convolutional Neural Networks (CNN)–Long Short-Term Memory (LSTM) algorithm, and the Fast Fourier Transform (FFT) technique. We found that it is easier to detect abnormal patterns that cannot be found in the existing time domain after preprocessing the data set through FFT. Our study shows that both train loss and test loss were well developed, with near zero convergence with the lowest loss rate compared to existing models such as LSTM. Our proposition for the model and our method of preprocessing the data greatly helps in understanding the abnormal pattern of unlabeled big data produced at the manufacturing site, and can be a strong foundation for detecting the threshold of the abnormal pattern of big data occurring at manufacturing sites.


2022 ◽  
pp. 62-90
Author(s):  
Tushar Mane ◽  
Ambika Pawar

Deep learning-based investigation mechanisms are available for conventional forensics, but not for IoT forensics. Dividing the system into different layers according to their functionalities, collecting data from each layer, finding the correlating factor, and using it for pattern detection is the fundamental concept behind the proposed intelligent system. The authors utilize this notion for embedding intelligence in forensics and speed up the investigation process by providing hints to the examiner. They propose a novel cross-layer learning architecture (CCLA) for IoT forensics. To the best of their knowledge, this is the first attempt to incorporate deep learning into the forensics of the IoT ecosystem.


Author(s):  
Stellan Ohlsson
Keyword(s):  

2019 ◽  
Vol 53 (3) ◽  
pp. 281-294
Author(s):  
Jean-Michel Foucart ◽  
Augustin Chavanne ◽  
Jérôme Bourriau

Nombreux sont les apports envisagés de l’Intelligence Artificielle (IA) en médecine. En orthodontie, plusieurs solutions automatisées sont disponibles depuis quelques années en imagerie par rayons X (analyse céphalométrique automatisée, analyse automatisée des voies aériennes) ou depuis quelques mois (analyse automatique des modèles numériques, set-up automatisé; CS Model +, Carestream Dental™). L’objectif de cette étude, en deux parties, est d’évaluer la fiabilité de l’analyse automatisée des modèles tant au niveau de leur numérisation que de leur segmentation. La comparaison des résultats d’analyse des modèles obtenus automatiquement et par l’intermédiaire de plusieurs orthodontistes démontre la fiabilité de l’analyse automatique; l’erreur de mesure oscillant, in fine, entre 0,08 et 1,04 mm, ce qui est non significatif et comparable avec les erreurs de mesures inter-observateurs rapportées dans la littérature. Ces résultats ouvrent ainsi de nouvelles perspectives quand à l’apport de l’IA en Orthodontie qui, basée sur le deep learning et le big data, devrait permettre, à moyen terme, d’évoluer vers une orthodontie plus préventive et plus prédictive.


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