Low-Frequency Noise Assessment for Deep Submicrometer CMOS Technology Nodes

2004 ◽  
Vol 151 (5) ◽  
pp. G307 ◽  
Author(s):  
C. Claeys ◽  
A. Mercha ◽  
E. Simoen
Keyword(s):  
Low Frequency ◽  
Cmos Technology ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Deep Submicrometer ◽  
Noise Assessment ◽  
Technology Nodes

scholarly journals Modeling of Statistical Low-Frequency Noise of Deep-Submicrometer MOSFETs

2005 ◽  
Vol 52 (7) ◽  
pp. 1576-1588 ◽  
Author(s):  
G.I. Wirth ◽  
J. Koh ◽  
R. daSilva ◽  
R. Thewes ◽  
R. Brederlow
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Deep Submicrometer

scholarly journals Low-Frequency Noise Assessment of Work Function Engineering Cap Layers in High-k Gate Stacks

2019 ◽  
Vol 8 (2) ◽  
pp. N25-N31 ◽  
Author(s):  
C. Claeys ◽  
R. Ritzenthaler ◽  
T. Schram ◽  
H. Arimura ◽  
N. Horiguchi ◽  
...  
Keyword(s):  
Work Function ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Gate Stacks ◽  
High K ◽  
Noise Assessment

Evolution of low frequency noise and noise variability through CMOS bulk technology nodes from 0.5μm down to 20nm

2014 ◽  
Vol 95 ◽  
pp. 28-31 ◽  
Author(s):  
E.G. Ioannidis ◽  
S. Haendler ◽  
C.G. Theodorou ◽  
S. Lasserre ◽  
C.A. Dimitriadis ◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Bulk Technology ◽  
Technology Nodes

Low-Frequency Noise Assessment of the Oxide Trap Density in Thick-Oxide Input-Output Transistors for DRAM Applications

2016 ◽  
Vol 5 (6) ◽  
pp. N27-N31 ◽  
Author(s):  
E. Simoen ◽  
R. Ritzenthaler ◽  
M.-J. Cho ◽  
T. Schram ◽  
N. Horiguchi ◽  
...  
Keyword(s):  
Low Frequency ◽  
Trap Density ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Input Output ◽  
Noise Assessment ◽  
Oxide Trap

Combined low-frequency noise and resistance measurements for void extraction in deep-submicrometer interconnects

2001 ◽  
Vol 30 (12) ◽  
pp. 1513-1519 ◽  
Author(s):  
L. W. Chu ◽  
W. K. Chim ◽  
K. L. Pey ◽  
J. Y. K. Yeo ◽  
L. Chan
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Deep Submicrometer

Low-Frequency Noise Assessment of Vertically Stacked Si n-Channel Nanosheet FETs With Different Metal Gates

2020 ◽  
Vol 67 (11) ◽  
pp. 4802-4807
Author(s):  
Alberto Oliveira ◽  
Anabela Veloso ◽  
Cor Claeys ◽  
Naoto Horiguchi ◽  
Eddy Simoen
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Metal Gates ◽  
Noise Assessment
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