Research on temperature sensitivity of Single-event Transient pulse width in 28-nm bulk technology

The influence of temperature on single-event transient (SET) pulse width has always been a hot issue in the field of anti-irradiation. Based on 3D-TCAD simulation, the temperature sensitivity of the SET pulse width of 28-nm bulk devices has been studied. The simulation results show that the electrical characteristics of the device shows an anti-temperature effect, but the worst case of SET pulse width still occurs at high temperature rather than low temperature. The influence of the triple-well structure on the temperature sensitivity of the SET pulse width has also been studied. The N+ deep well can significantly increase the SET pulse width when hitting NMOS device and enhance the temperature sensitivity of the SET pulse width. The research content of this article will provide reference for the design of radiation resistant chip.

0.5 V CMOS Inverter-Based Transconductance Amplifier with Quiescent Current Control

A two-stage CMOS transconductance amplifier based on the inverter topology, suitable for very low supply voltages and exhibiting rail-to-rail output capability is presented. The solution consists of the cascade of a noninverting and an inverting stage, both characterized by having only two complementary transistors between the supply rails. The amplifier provides class-AB operation with quiescent current control obtained through an auxiliary loop that utilizes the MOSFETs body terminals. Simulation results, referring to a commercial 28 nm bulk technology, show that the quiescent current of the amplifier can be controlled quite effectively, even adopting a supply voltage as low as 0.5 V. The designed solution consumes around 500 nA of quiescent current in typical conditions and provides a DC gain of around 51 dB, with a unity gain frequency of 1 MHz and phase margin of 70 degrees, for a parallel load of 1 pF and 1.5 MΩ. Settling time at 1% is 6.6 μs, and white noise is 125 nV/Hz.