The Characteristics of Slow and Fast Interface States in Fluorinated Metal Oxide Semiconductor Devices
1992 ◽
Vol 139
(10)
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pp. 2974-2977
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Keyword(s):
Keyword(s):
2009 ◽
Vol 27
(3)
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pp. 1261
Keyword(s):
2011 ◽
Vol 32
(7)
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pp. 076001
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2010 ◽
Vol 242
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pp. 012010
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