SiO2 / Si Interfaces Studied by Scanning Tunneling Microscopy and High Resolution Transmission Electron Microscopy
1992 ◽
Vol 139
(3)
◽
pp. 901-906
◽
1995 ◽
Vol 245
(1-2)
◽
pp. 84-92
◽
1992 ◽
Vol 10
(4)
◽
pp. 1329
◽
1990 ◽
Vol 8
(1)
◽
pp. 311-313
◽
1992 ◽
Vol 96
(22)
◽
pp. 9025-9028
◽
1991 ◽
Vol 117
(1-3)
◽
pp. 163-167
◽
2010 ◽
Vol 11
(3)
◽
pp. 469-472
◽