SiO2 / Si Interfaces Studied by Scanning Tunneling Microscopy and High Resolution Transmission Electron Microscopy

1992 ◽  
Vol 139 (3) ◽  
pp. 901-906 ◽  
Author(s):  
M. Niwa ◽  
M. Matsumoto ◽  
H. Iwasaki ◽  
M. Onada ◽  
R. Sinclair
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