Transmission electron microscopy observation of a single Ni dot fabricated using scanning tunneling microscopy

International Journal of Precision Engineering and Manufacturing ◽

10.1007/s12541-010-0054-8 ◽

2010 ◽

Vol 11 (3) ◽

pp. 469-472 ◽

Author(s):

Chul-Un Hong ◽

Hyung-Sub Kang ◽

Seong-Jong Kim ◽

Sung-Jun Kang ◽

Gi-Beum Kim

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Tunneling Microscopy ◽

Transmission Electron Microscopy Observation ◽

Scanning Tunneling ◽

Microscopy Observation ◽

Tunneling Microscopy ◽

Electron Microscopy Observation ◽

Transmission Electron

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In Situ Transmission Electron Microscopy Observation of Single Crystallization of Filled Aluminum Interconnection

Japanese Journal of Applied Physics ◽

10.1143/jjap.34.l1260 ◽

1995 ◽

Vol 34 (Part 2, No. 10A) ◽

pp. L1260-L1262 ◽

Author(s):

Jun-ichi Wada ◽

Hiroshi Toyoda ◽

Hisashi Kaneko ◽

Nobuo Hayasaka ◽

Hidehiro Yasuda ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Transmission Electron Microscopy Observation ◽

Microscopy Observation ◽

Electron Microscopy Observation ◽

Transmission Electron

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Self-assembled thulium silicide nanostructures on silicon(001) studied by scanning tunneling microscopy and transmission electron microscopy

Journal of Applied Physics ◽

10.1063/1.2896414 ◽

2008 ◽

Vol 103 (6) ◽

pp. 064308 ◽

Author(s):

J. Zhang ◽

M. A. Crimp ◽

Y. Cui ◽

J. Nogami

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Tunneling Microscopy ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Transmission Electron ◽

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Transmission Electron Microscopy Observation of Microstructure of Plasma-Sprayed Nanostructured Zirconia Coating

CrossRef Listing of Deleted DOIs ◽

10.1361/105996303772082260 ◽

2003 ◽

Vol 12 (4) ◽

pp. 523-529 ◽

Author(s):

Huang Chen ◽

Chuanxian Ding

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Transmission Electron Microscopy Observation ◽

Zirconia Coating ◽

Microscopy Observation ◽

Electron Microscopy Observation ◽

Transmission Electron ◽

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Transmission Electron Microscopy Observation of Reaction in Nanometer-scaled Au and Si Binary System

Japanese Journal of Applied Physics ◽

10.1143/jjap.43.850 ◽

2004 ◽

Vol 43 (2) ◽

pp. 850-854

Author(s):

Takashi Ishiguro ◽

Takahiro Shinbo ◽

Junichi Shimanuki

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Binary System ◽

Transmission Electron Microscopy Observation ◽

Microscopy Observation ◽

Electron Microscopy Observation ◽

Transmission Electron

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Etching technique for transmission electron microscopy observation of nanostructure of visible luminescent porous silicon

Applied Physics Letters ◽

10.1063/1.109673 ◽

1993 ◽

Vol 63 (10) ◽

pp. 1348-1350 ◽

Author(s):

O. Teschke ◽

M. C. Goncalves ◽

F. Galembeck

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Porous Silicon ◽

Transmission Electron Microscopy Observation ◽

Microscopy Observation ◽

Etching Technique ◽

Electron Microscopy Observation ◽

Transmission Electron

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Transmission electron microscopy observation of the ferroelastic phase transition in LEAD PHOSPHATE (Pb3(PO4)2)

Ecomaterials ◽

10.1016/b978-1-4832-8381-4.50207-9 ◽

1994 ◽

pp. 885-888

Author(s):

S. MORI ◽

N. YAMAMOTO ◽

Y. KOYAMA ◽

Y. UESU ◽

Y. YAMADA

Keyword(s):

Electron Microscopy ◽

Phase Transition ◽

Transmission Electron Microscopy ◽

Transmission Electron Microscopy Observation ◽

Microscopy Observation ◽

Lead Phosphate ◽

Electron Microscopy Observation ◽

Ferroelastic Phase Transition ◽

Transmission Electron

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In-Situ Transmission Electron Microscopy Observation of Electromigration in Au Thin Wires

Journal of Nanoscience and Nanotechnology ◽

10.1166/jnn.2012.6813 ◽

2012 ◽

Vol 12 (11) ◽

pp. 8741-8745

Author(s):

Yosuke Murakami ◽

Masashi Arita ◽

Kouichi Hamada ◽

Yasuo Takahashi

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Transmission Electron Microscopy Observation ◽

Microscopy Observation ◽

Electron Microscopy Observation ◽

Transmission Electron

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High-resolution transmission electron microscopy observation of the cross-sectional structure of reconstructed silicon (5,5,12) surface

Journal of Electron Microscopy ◽

10.1093/jmicro/50.6.541 ◽

2001 ◽

Vol 50 (6) ◽

pp. 541-544 ◽

Author(s):

J. Liu

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Transmission Electron Microscopy Observation ◽

Microscopy Observation ◽

Cross Sectional ◽

Electron Microscopy Observation ◽

Transmission Electron ◽

The Cross ◽

Sectional Structure

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Use of scanning tunneling microscopy and transmission electron microscopy to quantify and characterize CoSi2 roughness

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.585863 ◽

1992 ◽

Vol 10 (4) ◽

pp. 1329 ◽

Author(s):

R. C. Chapman

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Tunneling Microscopy ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Transmission Electron

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Cross‐sectional transmission electron microscopy observation of Nb/AlOx‐Al/Nb Josephson junctions

Applied Physics Letters ◽

10.1063/1.104556 ◽

1991 ◽

Vol 58 (6) ◽

pp. 645-647 ◽

Author(s):

Takeshi Imamura ◽

Shinya Hasuo

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Josephson Junctions ◽

Transmission Electron Microscopy Observation ◽

Microscopy Observation ◽

Cross Sectional ◽

Electron Microscopy Observation ◽

Transmission Electron

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