Electrical Characteristics of Low-Temperature Poly-Silicon Thin-Film Transistor Using a Stacked Pr2O3/SiOxNy Gate Dielectric

2019 ◽  
Vol 13 (1) ◽  
pp. 151-155
Author(s):  
Tung-Ming Pan ◽  
Tin-Wei Wu ◽  
Ching-Lin Chan ◽  
Kai-Ming Chen ◽  
Chih-Hong Lee

2019 ◽  
Vol 50 (1) ◽  
pp. 1425-1428 ◽  
Author(s):  
Can Zheng ◽  
Libin Liu ◽  
Yipeng Chen ◽  
Jiangnan Lu ◽  
Shiming Shi

2014 ◽  
Vol 15 (3) ◽  
pp. 135-138 ◽  
Author(s):  
C.M. Keum ◽  
J.K. Kim ◽  
S.J. Moon ◽  
S.K. Joo ◽  
B.S. Bae

2003 ◽  
Author(s):  
Guglielmo Fortunato ◽  
Antonio Valletta ◽  
Alessandra Bonfiglietti ◽  
Massimo Cuscuna ◽  
Paolo Gaucci ◽  
...  

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