Electrical Characteristics of Low-Temperature Poly-Silicon Thin-Film
Transistor Using a Stacked Pr2O3/SiOxNy Gate Dielectric
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2021 ◽
Vol 1907
(1)
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pp. 012019
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2019 ◽
Vol 50
(1)
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pp. 1425-1428
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2014 ◽
Vol 15
(3)
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pp. 135-138
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