Scanning synchrotron radiation X-ray fluorescence trace element analysis of microlayers of FeMn nodules; new data on ore forming processes in the Ocean

Author(s):  
I.P Dolbnya ◽  
A.V Golubev ◽  
K.V Zolotarev ◽  
V.A Bobrov ◽  
I.A Kalugin
1985 ◽  
Vol 29 ◽  
pp. 427-434
Author(s):  
Atsuo lida ◽  
Yohichi Gohshi ◽  
Hideki Maezawa

AbstractMicro and trace element analysis by X-ray fluorescence was carried out using synchrotron radiation from a bending magnet and an undulator for hard and soft X-ray excitation respectively. The minimum detection limits obtained in the hard X-ray region were less than pg, which corresponds to a spatial resolution of less than a hundred micronmeters, with a detection limit of a few ppm. Light elements such as oxygen, nitrogen and carbon in silicon compounds were analyzed by soft X-ray emission spectroscopy using undulator radiation. The minimum detectable amount of the light elements was greatly improved, since undulator radiation is very strong in intensity, and is highly collimated.


1983 ◽  
Vol 27 ◽  
pp. 557-562
Author(s):  
S.T. Davies ◽  
D.K. Bowen ◽  
M. Prins ◽  
A.J.J. Bos

The ability rapidly and quantitatively to detect trace elements in a host matrix is of great importance in many areas of science and engineering. This fact is underlined by the considerable amount of effort that has been put into developing such techniques as electron probe microanalysis, proton Induced x-ray emission (Pixe), the laser microprobe mass analyser (Lamma) as well as conventional x-ray fluorescence methods. Recently the availability of electron storage rings partially or wholly dedicated to producing intense beams of synchrotron radiation has provided a new tpol to complement the above mentioned techniques. This paper reports on work at Daresbury Laboratory on synchrotron x-ray fluorescence (SXRF) fo r quantitative trace element analysis.


2006 ◽  
Vol 61 (10-11) ◽  
pp. 1170-1174 ◽  
Author(s):  
Ana Elisa Sirito de Vives ◽  
Silvana Moreira ◽  
Sandra Maria Boscolo Brienza ◽  
Jean Gabriel Silva Medeiros ◽  
Mário Tomazello Filho ◽  
...  

1998 ◽  
Vol 5 (3) ◽  
pp. 1064-1066 ◽  
Author(s):  
Luc Ortega ◽  
Fabio Comin ◽  
Vincenzo Formoso ◽  
Andreas Stierle

Synchrotron radiation total-reflection X-ray fluorescence (SR-TXRF) has been applied to the impurity analysis of Si wafers using a third-generation synchrotron radiation undulator source. A lower limit of detectability (LLD) for Ni atoms of 17 fg (1.7 × 108 atoms cm−2) has been achieved with an optical set-up based on an Si(111) double-crystal monochromator and a horizontal sample geometry. These first results are very promising for synchrotron radiation trace element analysis since we estimate that it is possible to lower the LLD by a factor of about 25 by employing appropriate optics and detectors. The use of a crystal monochromator opens new possibilities to perform absorption and scattering experiments (NEXAFS and X-ray standing-wave methods) for chemical and structural analysis of ultratrace elements.


1976 ◽  
Vol 279 (2) ◽  
pp. 160-160 ◽  
Author(s):  
R. Zeisler ◽  
J. Cross ◽  
E. A. Schweikert

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