Determination of Heavy Metals in Environmental Water by Total Reflection X-Ray Fluorescence Method using Optimized Roentgen Optics Cut-Off Filter

1991 ◽  
Vol 35 (B) ◽  
pp. 959-963 ◽  
Author(s):  
A. I. Egorov ◽  
L. P. Kablna ◽  
I. A. Kondurov ◽  
E. M. Korotkikh ◽  
V. V. Martynov ◽  
...  
Keyword(s):  
Heavy Metals ◽  
Critical Angle ◽  
Environmental Water ◽  
Total Reflection ◽  
Angular Deviation ◽  
Narrow Beam ◽  
X Ray ◽  
Order Of Magnitude ◽  
Elemental Contents

The total reflection x-ray fluorescence (TXRF) method of analyzing elemental contents Is based on the small angle irradiation of thin samples placed on a total reflecting backing with a narrow photon beam. Two instrumental problems are to be solved here. The first is to form the narrow beam with a small angular deviation. The usual way to solve this problem is to use collimators with small solid angles. These angles must be less than the critical angle for x-ray total reflection, which, in the energy range 10 - 20 keV has an order of magnitude around 10−3 rad.

Determination of Heavy Metals in Environmental Water by Total Reflection X-Ray Fluorescence Method Using Optimized Roentgen Optics Cut-Off Filter

1992 ◽  
pp. 959-963 ◽  
Author(s):  
A. I. Egorov ◽  
L. P. Kabina ◽  
I. A. Kondurov ◽  
E. M. Korotkikh ◽  
V. V. Martynov ◽  
...  
Keyword(s):  
Heavy Metals ◽  
Environmental Water ◽  
Total Reflection ◽  
Fluorescence Method ◽  
X Ray

Determination of some heavy metals (Fe, Cu, Zn and Pb) in blood by total reflection X-ray fluorescence

2003 ◽  
Vol 107 ◽  
pp. 203-206 ◽  
Author(s):  
M. Bounakhla ◽  
A. Doukkali ◽  
K. Lalaoui ◽  
H. Aguenaou ◽  
N. Mokhtar ◽  
...  
Keyword(s):  
Heavy Metals ◽  
Total Reflection ◽  
X Ray

Detection and quantitative determination of heavy metals in electronic cigarette refill liquids using Total Reflection X-ray Fluorescence Spectrometry

2018 ◽  
Vol 116 ◽  
pp. 233-237 ◽  
Author(s):  
Eleni Kamilari ◽  
Konstantinos Farsalinos ◽  
Konstantinos Poulas ◽  
Christos G. Kontoyannis ◽  
Malvina G. Orkoula
Keyword(s):  
Heavy Metals ◽  
Quantitative Determination ◽  
Total Reflection ◽  
Electronic Cigarette ◽  
Fluorescence Spectrometry ◽  
X Ray

Characterisation of Interfaces in SiGe Superlatrlces by Combined Grazing Incidence X-Ray Fluorescence and Reflectivity

1991 ◽  
Vol 238 ◽  
Author(s):  
Adrian R. Powell ◽  
Jaroslav Bradler ◽  
Charles R. Thomas ◽  
Richard A. Kubiak ◽  
D. Keith Bowen ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Silicon Germanium ◽  
Critical Angle ◽  
Grazing Angle ◽  
Single Layer ◽  
High Sensitivity ◽  
Grazing Incidence ◽  
Total Reflection ◽  
X Ray

ABSTRACTX-Ray reflectivity enables the determination of interface and surface roughness along with the variations present in the electron density. Total reflection X-ray fluorescence allows surface analysis with high sensitivity and quantification. By use of grazing angle x-ray fluorescence taken simultaneously with the reflectivity measurements, over a range of angles near the critical angle, it is possible in principle to produce a depth profile of each element, with a composition sensitivity of 0.0002%. A silicon-germanium single layer was used to calibrate the instrument and a Si-Ge 5- period superlattice for a demonstration measurement.

Development of a method for multielemental determination in water by EDXRF with radioisotopic source of 238Pu.

2019 ◽  
Vol 7 (2A) ◽  
Author(s):  
Camilo Fuentes Serrano ◽  
Juan Reinaldo Estevez Alvares ◽  
Alfredo Montero Alvarez ◽  
Ivan Pupo Gonzales ◽  
Zahily Herrero Fernandez ◽  
...  
Keyword(s):  
Thin Layer ◽  
Expanded Uncertainty ◽  
Considerable Decrease ◽  
X Ray ◽  
Precipitation Efficiency ◽  
Method Of Determination ◽  
Sensitivity Curves ◽  
Order Of Magnitude ◽  
Metrological Parameters

A method for determination of Cr, Fe, Co, Ni, Cu, Zn, Hg and Pb in waters by Energy Dispersive X Ray Fluorescence (EDXRF) was implemented, using a radioisotopic source of 238Pu. For previous concentration was employed a procedure including a coprecipitation step with ammonium pyrrolidinedithiocarbamate (APDC) as quelant agent, the separation of the phases by filtration, the measurement of filter by EDXRF and quantification by a thin layer absolute method. Sensitivity curves for K and L lines were obtained respectively. The sensitivity for most elements was greater by an order of magnitude in the case of measurement with a source of 238Pu instead of 109Cd, which means a considerable decrease in measurement times. The influence of the concentration in the precipitation efficiency was evaluated for each element. In all cases the recoveries are close to 100%, for this reason it can be affirmed that the method of determination of the studied elements is quantitative. Metrological parameters of the method such as trueness, precision, detection limit and uncertainty were calculated. A procedure to calculate the uncertainty of the method was elaborated; the most significant source of uncertainty for the thin layer EDXRF method is associated with the determination of instrumental sensitivities. The error associated with the determination, expressed as expanded uncertainty (in %), varied from 15.4% for low element concentrations (2.5-5 μg/L) to 5.4% for the higher concentration range (20-25 μg/L).

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