scholarly journals The Effectiveness of Mini Primer STR CODIS in DNA Degradation as the Effect of High-Temperature Exposure

2020 ◽  
Vol 2020 ◽  
pp. 1-6
Author(s):  
Ahmad Yudianto ◽  
Fery Setiawan
Keyword(s):  
High Temperature ◽  
Dna Analysis ◽  
Forensic Identification ◽  
Degraded Dna ◽  
Forensic Dna ◽  
Criminal Cases ◽  
High Temperature Exposure ◽  
Dna Contents ◽  
Molar Teeth ◽  
Temperature Exposure

Background. More and more today, forensic identification through deoxyribonucleic acid (DNA) examination has achieved greater recognition in supporting Indonesia’s law enforcement. Such examination is to determine the origin of a child, paternity cases, genealogical relation, or identifying unknown crime victims. However, along with the development of this DNA material examination, problems arise. DNA undergoes a degradation, commonly known as degraded DNA, which is one of the serious issues frequently encountered by forensic and DNA experts. Some forensic DNA experts take one of the alternatives to overcome this issue by implementing a mini primer set that is through a method to reduce the size of STR assays on DNA core locus examination. Methods. In this study, the writers conduct research using the mini primers of CSF1PO, FGA, and D21S11 of the molar teeth exposed to 500°C temperature for 20 and 30 minutes and 750°C for the same amount of time.Result. The findings show the DNA contents of molar teeth significantly ( p < 0.05 ) decreased as the effect of high-temperature exposure. PCR result visualization shows CSF1PO is the only locus detected with mini primer exposed to 750°C temperature for 30 minutes (the highest exposure during this research). Conclusions. This finding suggests that this locus is potential in examining identification through DNA analysis, especially on a degraded condition as the effect of high-temperature exposure. Besides, this could accelerate the identification process especially on mass disaster events or criminal cases.

scholarly journals Nuclei DNA Damage Due to Extreme High-Temperature Exposure during Forensic Identification Examination

2020 ◽  
Vol 52 (4) ◽  
Author(s):  
Ahmad Yudianto ◽  
Masniari Novita ◽  
Ariyanto Wibowo ◽  
Fery Setiawan
Keyword(s):  
Dna Damage ◽  
High Temperature ◽  
Dna Analysis ◽  
Molar Tooth ◽  
High Temperature Exposure ◽  
Identification Process ◽  
Second Molar ◽  
Extreme High Temperature ◽  
Molar Teeth ◽  
Temperature Exposure

ccurate personal identification is important in investigations because an error in the identification process may bring fatal consequences during trial. The most common identification process is the Deoxyribonucleic acid [DNA] analysis. Degraded DNA sample due to extremely high-temperature exposure may limit DNA analysis. This study aimed to analyze DNA damage patterns caused by an extremely high temperature using STR (short tandem repeat) CODIS marker. This study was conducted at the Forensic and Medicolegal Department, Laboratorium Balai Besar Kesehatan Surabaya, Ministry of Health of the Republic of Indonesia, Human Genetic Study Group of Universitas Airlangga, and Faculty of Science and Technology of Universitas Brawijaya Malang from July until October 2009. Results of PCR visualization using STR CODIS for costae demonstrated that the THO1 detection (+) in 1,2500C - 40’: 25% and the TPOX detection (+) in 1,0000C - 30’: 50% whereas the results from molar teeth showed that the THOI locus detection (+) in 1,2500C - 30’: 25% and TPOX in 1,0000C - 40’: 50%. Results for PCR visualization using mini-STR CODIS for the costae presented that the mini-THOI in 1,2500C - 20’: 50% (+) while for the molar tooth the mini-THOI in 1,2500C - 30’ : 25% (+) and mini-TPOX in 1,0000C - 40’ : 50% (+). All loci were detected on costae and second molar teeth samples of the control group. Thus, extreme high-temperature exposure significantly decreased the DNA level of second costae and second molar tooth. Sequence patterns of STR loci successfully detected were TPOX, THO1, and CSF1PO.

Creep Properties and Interfacial Microstructure of SiC Whisker Reinforced Si3N4

1989 ◽  
Vol 170 ◽  
Author(s):  
Håkan A. Swan ◽  
Colette O'meara
Keyword(s):  
High Temperature ◽  
Creep Resistance ◽  
Interfacial Microstructure ◽  
Deformation Mechanisms ◽  
Amorphous Films ◽  
Creep Tests ◽  
Creep Properties ◽  
High Temperature Exposure ◽  
Temperature Exposure

AbstractPreliminary creep tests were performed on SiC whisker reinforced and matrix Si3N4 material fabricated by the NPS technique. The material was extensively crystallised in the as received material, leaving only thin amorphous films surrounding the grains. No improvement in the creep resistance could be detected for the whisker reinforced material. The deformation mechanisms were found to be that of cavitation in the form of microcracks, predominantly at the whisker/matrix interfaces, and the formation of larger cracks. Extensive oxidation of the samples, as a result of high temperature exposure to air, was observed for the materials tested at 1375°C.

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