scholarly journals Automatic Determination of Left- and Right-Hand Bone Age in the First Zurich Longitudinal Study

2010 ◽  
Vol 74 (1) ◽  
pp. 50-55 ◽  
Author(s):  
David D. Martin ◽  
Julia Neuhof ◽  
Oskar G. Jenni ◽  
Michael B. Ranke ◽  
Hans Henrik Thodberg
2009 ◽  
Vol 39 (6) ◽  
pp. 591-597 ◽  
Author(s):  
Rick R. van Rijn ◽  
Maarten H. Lequin ◽  
Hans Henrik Thodberg

2020 ◽  
Vol 18 (Suppl.1) ◽  
pp. 695-698
Author(s):  
P. Angelova ◽  
P. Petkov

Reliable data on physical fitness and determination of the functional state of the body reflect the level of physical capabilities and the level of development of motor skills. Objective: Determination of individual physiometric indicators in students. Contingent: 130 female students of Trakia University. The average value of the vital capacity in the studied students is 3, 60, and vital indicator 61,61. With the left and right hand dynamometer, mean right hand values ​​of 15,46 kg were found, and left - 12,76 kg. Force strength is set at 63,42kg. Conclusion: The relative share of students with low values ​​of the vital capacity is high, the values ​​for dynamometry force are also low; there is a disproportion between good physical development due to acceleration factors and recorded retention or deterioration of physical capacity.


2009 ◽  
Author(s):  
Jos J. Adam ◽  
Susan Hoonhorst ◽  
Rick Muskens ◽  
Jay Pratt ◽  
Martin H. Fischer

2000 ◽  
Vol 28 (1-2) ◽  
pp. 237-245 ◽  
Author(s):  
Nasser Hosseini ◽  
Blanka Hejdukova ◽  
Pall E. Ingvarsson ◽  
Bo Johnels ◽  
Torsten Olsson

Author(s):  
Romain Desplats ◽  
Timothee Dargnies ◽  
Jean-Christophe Courrege ◽  
Philippe Perdu ◽  
Jean-Louis Noullet

Abstract Focused Ion Beam (FIB) tools are widely used for Integrated Circuit (IC) debug and repair. With the increasing density of recent semiconductor devices, FIB operations are increasingly challenged, requiring access through 4 or more metal layers to reach a metal line of interest. In some cases, accessibility from the front side, through these metal layers, is so limited that backside FIB operations appear to be the most appropriate approach. The questions to be resolved before starting frontside or backside FIB operations on a device are: 1. Is it do-able, are the metal lines accessible? 2. What is the optimal positioning (e.g. accessing a metal 2 line is much faster and easier than digging down to a metal 6 line)? (for the backside) 3. What risk, time and cost are involved in FIB operations? In this paper, we will present a new approach, which allows the FIB user or designer to calculate the optimal FIB operation for debug and IC repair. It automatically selects the fastest and easiest milling and deposition FIB operations.


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